Inventor · disambiguated record
Jerzy Lobacz
Also filed as: LOBACZ JERZY
6 granted patents·1 pending application·395 citations·filing 1995–2009
86Inventor score
Top patents by PatentIndex Score
7 records- 0196US5742174AMembrane for holding a probe tip in proper locationPROBE TECHNOLOGY·Filed 1995·Granted Apr 21, 1998·198 cites·20 claims
- 0293US6580283B1Wafer level burn-in and test methodsAEHR TEST SYSTEMS·Filed 1999·Granted Jun 17, 2003·109 cites·35 claims
- 0387US5884395AAssembly structure for making integrated circuit chip probe cardsPROBE TECHNOLOGY·Filed 1997·Granted Mar 23, 1999·76 cites·21 claims
- 0469US6682945B2Wafer level burn-in and electrical test system and methodAEHR TEST SYSTEMS·Filed 2001·Granted Jan 27, 2004·10 cites·21 claims
- 0548US7928754B2Wafer level burn-in and electrical test system and methodAEHR TEST SYSTEMS·Filed 2009·Granted Apr 19, 2011·0 cites·5 claims
- 0646US7619428B2Wafer level burn-in and electrical test system and methodAEHR TEST SYSTEMS·Filed 2003·Granted Nov 17, 2009·2 cites·1 claims
- 0736US2007213847A1Apparatus for, and method of, positioning an interface unit of an automatic test systemSPRAGUE WILLIAM T·Filed 2006·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Jerzy Lobacz files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →