Inventor · disambiguated record
Jeffrey Loewecke
Also filed as: LOEWECKE JEFFREY · LOEWECKE JEFFREY G
6 granted patents·2 pending applications·31 citations·filing 2004–2008
78Inventor score
Top patents by PatentIndex Score
8 records- 0179US7208330B2Method for varying the uniformity of a dopant as it is placed in a substrate by varying the speed of the implant across the substrateTEXAS INSTRUMENTS INC·Filed 2005·Granted Apr 24, 2007·10 cites·11 claims
- 0266US7397046B2Method for implanter angle verification and calibrationTEXAS INSTRUMENTS INC·Filed 2004·Granted Jul 8, 2008·12 cites·20 claims
- 0358US7232744B2Method for implanting dopants within a substrate by tilting the substrate relative to the implant sourceTEXAS INSTRUMENTS INC·Filed 2004·Granted Jun 19, 2007·7 cites·20 claims
- 0454US7807978B2Divergent charged particle implantation for improved transistor symmetryTEXAS INSTRUMENTS INC·Filed 2008·Granted Oct 5, 2010·0 cites·10 claims
- 0552US2008142724A1Divergent Charged Particle Implantation for Improved Transistor SymmetryTEXAS INSTRUMENTS INC·Filed 2008·Application pending·0 cites
- 0643US7385202B2Divergent charged particle implantation for improved transistor symmetryTEXAS INSTRUMENTS INC·Filed 2004·Granted Jun 10, 2008·0 cites·5 claims
- 0742US7153711B2Method for improving a drive current for semiconductor devices on a wafer-by-wafer basisTEXAS INSTRUMENTS INC·Filed 2004·Granted Dec 26, 2006·2 cites·20 claims
- 0839US2009166564A1Methods for monitoring implanter performanceMOSER BENJAMIN G·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →