Inventor · disambiguated record
Jens Timo Neumann
Also filed as: NEUMANN JENS · NEUMANN JENS TIMO
27 granted patents·34 pending applications·73 citations·filing 2002–2025
94Inventor score
Top patents by PatentIndex Score
61 records- 0190US10606048B2Imaging optical unit for a metrology system for examining a lithography maskZEISS CARL SMT GMBH·Filed 2017·Granted Mar 31, 2020·3 cites·21 claims
- 0287US12175650B2Processing image data setsZEISS CARL SMT GMBH·Filed 2021·Granted Dec 24, 2024·2 cites·24 claims
- 0387US10901391B1Multi-scanning electron microscopy for wafer alignmentZEISS CARL SMT GMBH·Filed 2019·Granted Jan 26, 2021·10 cites·20 claims
- 0485US9703205B2Measuring an optical symmetry property on a projection exposure apparatusZEISS CARL SMT GMBH·Filed 2015·Granted Jul 11, 2017·3 cites·20 claims
- 0583US8959912B2Vehicle comprising a charged combustion engine and method for operating a vehicle comprising a charged combustion engineHOESS BERNHARD·Filed 2012·Granted Feb 24, 2015·16 cites·18 claims
- 0683US7404451B2Wobble device for a hand-held power tool and a hand-held power tool with the wobble deviceHILTI AG·Filed 2006·Granted Jul 29, 2008·14 cites·4 claims
- 0778US2025357165A1Methods of cross-section imaging of an inspection volume in a waferZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0878US2024328970A1Method of 3d volume inspection of semiconductor wafers with increased throughputZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 0965US11915908B2Method for measuring a sample and microscope implementing the methodZEISS CARL SMT GMBH·Filed 2021·Granted Feb 27, 2024·0 cites·21 claims
- 1065US10675575B2Method for producing a filter medium, and a filter mediumMANN & HUMMEL GMBH·Filed 2018·Granted Jun 9, 2020·0 cites·12 claims
- 1164US7308997B2Combustion-operated setting toolHILTI AG·Filed 2006·Granted Dec 18, 2007·7 cites·9 claims
- 1263US2023196189A1Measurement method and apparatus for semiconductor features with increased throughputZEISS CARL SMT GMBH·Filed 2022·Application pending·0 cites
- 1362US2025362253A13d volume inspection method and method of configuring of a 3d volume inspection methodZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 1461US12148139B2Methods and evaluation devices for analyzing three-dimensional data sets representing devicesZEISS CARL SMT GMBH·Filed 2021·Granted Nov 19, 2024·0 cites·20 claims
- 1561US8066455B2Connection system for two tool partsNEUMANN JENS·Filed 2005·Granted Nov 29, 2011·5 cites·20 claims
- 1661US2024242334A1Method for defect detection in a semiconductor sample in sample images with distortionCARL ZEISS MULTISEM GMBH·Filed 2024·Application pending·0 cites
- 1761US2024411296A1Computer implemented method for the detection and classification of anomalies in an imaging dataset of a wafer, and systems making use of such methodsZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 1861US2025022680A13d volume inspection of semiconductor wafers with increased throughput and accuracyZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 1960US2025069958A1Dual beam systems and methods for decoupling the working distance of a charged particle beam device from focused ion beam geometry induced constraintsZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 2059US12288706B2Parameterizing x-ray scattering measurement using slice-and-image tomographic imaging of semiconductor structuresZEISS CARL SMT GMBH·Filed 2022·Granted Apr 29, 2025·0 cites·16 claims
- 2159US11241645B2Method for producing a filter medium, and a filter mediumMANN & HUMMEL GMBH·Filed 2020·Granted Feb 8, 2022·0 cites·10 claims
- 2258US2024331179A13d volume inspection of semiconductor wafers with increased accuracyZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 2358US2024404786A1Method to investigate a semiconductor sample layer by layer and investigation device to perform such methodZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 2457US2024226775A9Device and method for encasing a filter unit and/or separation unitNEUFILTER GMBH·Filed 2022·Application pending·0 cites
- 2557US2024311698A1Measurement method and apparatus for semiconductor features with increased throughputZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 2656US11436506B2Method and devices for determining metrology sitesZEISS CARL SMT GMBH·Filed 2020·Granted Sep 6, 2022·0 cites·27 claims
- 2756US2025021828A1Computer implemented method for the detection of anomalies in an imaging dataset of a wafer, and systems making use of such methodsZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 2855US2025216842A1Computer implemented method for defect detection in an imaging dataset of a wafer, corresponding computer-readable medium, computer program product and systems making use of such methodsZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 2954US2024214784A1Systems and methods for wireless activation and communications in concrete sensorsHILTI AG·Filed 2023·Application pending·0 cites
- 3054US2024087134A1Segmentation or cross sections of high aspect ratio structuresZEISS CARL SMT GMBH·Filed 2023·Application pending·0 cites
- 3153US2023267627A1Transferring alignment information in 3d tomography from a first set of images to a second set of imagesZEISS CARL SMT GMBH·Filed 2023·Application pending·0 cites
- 3252US11728130B2Method of recording an image using a particle microscopeZEISS CARL SMT GMBH·Filed 2021·Granted Aug 15, 2023·0 cites·26 claims
- 3352US8770899B2Counterbalanced boring tool with clamping deviceFRANK PETER·Filed 2008·Granted Jul 8, 2014·1 cites·14 claims
- 3452US6880738B2Propellant charge magazine for a setting toolHILTI AG·Filed 2003·Granted Apr 19, 2005·8 cites·15 claims
- 3552US2023260105A1Defect detection for semiconductor structures on a waferZEISS CARL SMT GMBH·Filed 2023·Application pending·0 cites
- 3651US2024181623A1Construction table for producing a filter module, and method for producing a filter moduleNEUFILTER GMBH·Filed 2022·Application pending·0 cites
- 3751US2024281952A13d volume inspection method and method of configuring of a 3d volume inspection methodZEISS CARL SMT GMBH·Filed 2023·Application pending·0 cites
- 3850US11935228B2Method to acquire a 3D image of a sample structureZEISS CARL SMT GMBH·Filed 2021·Granted Mar 19, 2024·0 cites·26 claims
- 3949US9785052B2Optical system of a microlithographic projection exposure apparatus and method of reducing image placement errorsZEISS CARL SMT GMBH·Filed 2013·Granted Oct 10, 2017·0 cites·20 claims
- 4048US10502566B2Method for examining object properties of an object in a substrateHILTI AG·Filed 2015·Granted Dec 10, 2019·0 cites·16 claims
- 4147US11266935B2Filter medium, method for producing same, and use of the filter medium in a filter elementMANN & HUMMEL GMBH·Filed 2019·Granted Mar 8, 2022·0 cites·13 claims
- 4247US8506211B2Counterbalanced boring toolFRANK PETER·Filed 2008·Granted Aug 13, 2013·0 cites·14 claims
- 4347US6978919B2Holder for a drive piston of a setting toolHILTI AG·Filed 2002·Granted Dec 27, 2005·4 cites·6 claims
- 4447US2009008115A1Hand-held power tool with a slip clutchGUO KEVIN·Filed 2008·Application pending·0 cites
- 4546US12045969B2Automated root cause analysis for defect detection during fabrication processes of semiconductor structuresZEISS CARL SMT GMBH·Filed 2020·Granted Jul 23, 2024·0 cites·20 claims
- 4646US2021129060A1Filter medium, method for producing same and the filter medium in a filter elementMANN & HUMMEL GMBH·Filed 2020·Application pending·0 cites
- 4746US2022138973A1Cross section imaging with improved 3d volume image reconstruction accuracyZEISS CARL SMT GMBH·Filed 2021·Application pending·0 cites
- 4845US2020258212A1Error reduction in images which were generated with charged particles and with the aid of machine-learning-based methodsZEISS CARL SMT GMBH·Filed 2020·Application pending·0 cites
- 4944US9884606B2Belt-retractor housing shellTRW AUTOMOTIVE GMBH·Filed 2013·Granted Feb 6, 2018·0 cites·12 claims
- 5044US2007084320A1Cutting tool with very fine adjustmentSANDVIK INTELLECTUAL PROPERTY·Filed 2006·Application pending·0 cites
Showing the top 50 of 61 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Jens Timo Neumann files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →