Inventor · disambiguated record
Jens Oster
Also filed as: OSTER JENS
5 granted patents·3 pending applications·4 citations·filing 2017–2024
67Inventor score
Files withZEISS CARL SMT GMBH8
Top patents by PatentIndex Score
8 records- 0177US10372032B2Method and device for permanently repairing defects of absent material of a photolithographic maskZEISS CARL SMT GMBH·Filed 2017·Granted Aug 6, 2019·2 cites·19 claims
- 0273US11886126B2Apparatus and method for removing a single particulate from a substrateZEISS CARL SMT GMBH·Filed 2021·Granted Jan 30, 2024·1 cites·39 claims
- 0371US11079674B2Method and apparatus for ascertaining a repair shape for processing a defect of a photolithographic maskZEISS CARL SMT GMBH·Filed 2019·Granted Aug 3, 2021·1 cites·20 claims
- 0456US12493238B2Method, device and computer program for repairing a mask defectZEISS CARL SMT GMBH·Filed 2022·Granted Dec 9, 2025·0 cites·32 claims
- 0556US2024393269A1Method and device for analysing an image of a microlithographic microstructured sampleZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 0655US2024411223A1Method for processing dc marks for repairing lithography masksZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 0755US2023238209A1Apparatus for analyzing and/or processing a sample with a particle beam and methodZEISS CARL SMT GMBH·Filed 2023·Application pending·0 cites
- 0852US10732501B2Method and device for permanently repairing defects of absent material of a photolithographic maskZEISS CARL SMT GMBH·Filed 2019·Granted Aug 4, 2020·0 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →