Inventor · disambiguated record
Jen-Pan Wang
Also filed as: WANG JEN-PAN
38 granted patents·1 pending application·160 citations·filing 1999–2023
96Inventor score
Files withTAIWAN SEMICONDUCTOR MFG16TAIWAN SEMICONDUCTOR MFG CO LTD16LIU CHIEN-HSUAN2WANG JEN-PAN2LIN MEI-HSUAN1
Top patents by PatentIndex Score
39 records- 0189US8815679B1Structure of metal gate MIMTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Aug 26, 2014·13 cites·20 claims
- 0285US8802333B2Reflective lithography masks and systems and methodsLIU CHIEN-HSUAN·Filed 2012·Granted Aug 12, 2014·4 cites·22 claims
- 0385US8533639B2Optical proximity correction for active region design layoutLIN MEI-HSUAN·Filed 2011·Granted Sep 10, 2013·7 cites·20 claims
- 0483US10008501B2Sandwich EPI channel for device enhancementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jun 26, 2018·3 cites·20 claims
- 0583US9466670B2Sandwich epi channel for device enhancementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Oct 11, 2016·5 cites·20 claims
- 0682US9449811B2Air-gap scheme for BEOL processTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Sep 20, 2016·4 cites·20 claims
- 0782US6251719B1Poly gate process that provides a novel solution to fix poly-2 residue under poly-1 oxide for charge coupled devicesTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Jun 26, 2001·31 cites·35 claims
- 0881US9261792B2Reflective lithography masks and systems and methodsTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Feb 16, 2016·2 cites·20 claims
- 0980US9269761B2Metal-insulator-metal capacitorTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Feb 23, 2016·6 cites·19 claims
- 1079US10062603B2Air-gap scheme for BEOL processTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Aug 28, 2018·2 cites·20 claims
- 1178US10608094B2Semiconductor device and method of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Mar 31, 2020·2 cites·20 claims
- 1273US9093375B2Metal gate structure and methodTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jul 28, 2015·2 cites·13 claims
- 1371US6284557B1Optical sensor by using tunneling diodeTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Sep 4, 2001·34 cites·37 claims
- 1468US6362491B1Method of overlay measurement in both X and Y directions for photo stitch processTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Mar 26, 2002·26 cites·20 claims
- 1567US9231069B2Metal gate structure and methodTAIWAN SEMICONDUCTOR MFG·Filed 2015·Granted Jan 5, 2016·1 cites·20 claims
- 1666US8872248B2Capacitors comprising slot contact plugsTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Oct 28, 2014·2 cites·20 claims
- 1766US8772054B2Focus control method for photolithographyWANG JEN-PAN·Filed 2011·Granted Jul 8, 2014·1 cites·15 claims
- 1865US8775982B2Optical proximity correction for active region design layoutTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jul 8, 2014·2 cites·20 claims
- 1963US9287139B2Re-crystallization for boosting stress in MOS deviceTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Mar 15, 2016·1 cites·20 claims
- 2063US8962353B2System and methods for semiconductor device performance prediction during processingWANG JEN-PAN·Filed 2011·Granted Feb 24, 2015·2 cites·20 claims
- 2163US8648341B2Methods and apparatus for testing pads on wafersYANG CHUNG-YUAN·Filed 2012·Granted Feb 11, 2014·2 cites·20 claims
- 2260US10644130B2Metal-oxide-semiconductor field-effect transistor with spacer over gateTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2012·Granted May 5, 2020·1 cites·20 claims
- 2359US9110386B2Focus control apparatus for photolithographyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Aug 18, 2015·0 cites·20 claims
- 2458US9599888B2Reflective lithography masks and systems and methodsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Mar 21, 2017·0 cites·20 claims
- 2557US12237282B2Semiconductor device and method of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Feb 25, 2025·0 cites·20 claims
- 2654US9478466B2Metal gate structure and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Oct 25, 2016·0 cites·20 claims
- 2754US2025022793A1Semiconductor device and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 2853US10686030B2Resistor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jun 16, 2020·0 cites·20 claims
- 2951US9978744B2Resistor and metal-insulator-metal capacitor structure and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted May 22, 2018·0 cites·20 claims
- 3050US9099439B2Semiconductor device with silicide capTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Aug 4, 2015·0 cites·19 claims
- 3149US9768243B2Structure of resistorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Sep 19, 2017·0 cites·20 claims
- 3249US9362269B2Resistor and metal-insulator-metal capacitor structure and methodTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jun 7, 2016·0 cites·20 claims
- 3346US9217917B2Three-direction alignment markTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Dec 22, 2015·0 cites·20 claims
- 3445US8735024B2Non-planar lithography mask and system and methodsLIU CHIEN-HSUAN·Filed 2012·Granted May 27, 2014·0 cites·19 claims
- 3542US10256233B2Device including resistor-capacitor (RC) structure and method of making the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Apr 9, 2019·0 cites·14 claims
- 3640US6693317B2Optical sensor by using tunneling diodeTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Feb 17, 2004·0 cites·4 claims
- 3739US6582981B2Method of using a tunneling diode in optical sensing devicesTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Jun 24, 2003·0 cites·4 claims
- 3838US6319839B1Approach to form an inter-polysilicon oxide (IPO) layer for charge coupled devicesTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Nov 20, 2001·7 cites·22 claims
- 3935US9281246B2Strain adjustment in the formation of MOS devicesWANG YI-WEN·Filed 2012·Granted Mar 8, 2016·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →