Inventor · disambiguated record
Ji-Dih Hu
Also filed as: HU JI-DIH
7 granted patents·5 pending applications·6 citations·filing 2006–2025
74Inventor score
Top patents by PatentIndex Score
12 records- 0193US11562915B2Methods, systems, and apparatus for optically monitoring individual lampsAPPLIED MATERIALS INC·Filed 2022·Granted Jan 24, 2023·3 cites·20 claims
- 0277US10571337B2Thermal cooling member with low temperature controlAPPLIED MATERIALS INC·Filed 2017·Granted Feb 25, 2020·2 cites·12 claims
- 0377US2025246461A1Multi-zone lamp heating and temperature monitoring in epitaxy process chamberAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 0469US11664250B2Methods and apparatus for measuring edge ring temperatureAPPLIED MATERIALS INC·Filed 2022·Granted May 30, 2023·0 cites·20 claims
- 0569US11189508B2Purged viewport for quartz dome in epitaxy reactorAPPLIED MATERIALS INC·Filed 2019·Granted Nov 30, 2021·1 cites·15 claims
- 0668US2022367216A1Multi-zone lamp heating and temperature monitoring in epitaxy process chamberAPPLIED MATERIALS INC·Filed 2021·Application pending·0 cites
- 0763US10948353B2Thermal processing chamber with low temperature controlAPPLIED MATERIALS INC·Filed 2020·Granted Mar 16, 2021·0 cites·20 claims
- 0859US11342209B2Methods and apparatus for measuring edge ring temperatureAPPLIED MATERIALS INC·Filed 2019·Granted May 24, 2022·0 cites·20 claims
- 0955US2025305182A1In-situ pyrometer for silicon carbide waferVEECO INSTR INC·Filed 2025·Application pending·0 cites
- 1054US2024142310A1Lightpipe for high temperature substrate processingVEECO INSTR INC·Filed 2023·Application pending·0 cites
- 1144US10930530B2Methods and apparatus for wafer temperature measurementAPPLIED MATERIALS INC·Filed 2019·Granted Feb 23, 2021·0 cites·19 claims
- 1240US2008033300A1Systems and methods for monitoring temperature during electrosurgery or laser therapyHOANG ANH·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →