Inventor · disambiguated record
Jih-San Lee
Also filed as: LEE JIH SAN
1 granted patent·2 pending applications·3 citations·filing 2010–2024
21Inventor score
Top patents by PatentIndex Score
3 records- 0157US8283941B2Alternating current (AC) stress test circuit, method for evaluating AC stress induced hot carrier injection (HCI) degradation, and test structure for HCI degradation evaluationKUO SUNG-NIEN·Filed 2010·Granted Oct 9, 2012·3 cites·18 claims
- 0247US2025311441A1Electrostatic discharge protection circuit using gan-based devicesUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 0347US2025203957A1Fully-isolated mos deviceUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Jih-San Lee files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →