Inventor · disambiguated record

Ji{Hacek Over (R)}Í Pet{Hacek Over (R)}Ek

Also filed as: PET{HACEK OVER (R)}EK JI{HACEK OVER (R)}Í

2 granted patents·2 citations·filing 2020–2020

34Inventor score

Technology areasG01N G06T

Files withFEI CO2

Top patents by PatentIndex Score

2 records

0178US11519871B2Method of examining a sample using a charged particle microscopeFEI CO·Filed 2020·Granted Dec 6, 2022·2 cites·18 claims
0246US11971372B2Method of examining a sample using a charged particle microscopeFEI CO·Filed 2020·Granted Apr 30, 2024·0 cites·11 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →