Inventor · disambiguated record
Jing Su
Also filed as: SU JING · SU JING-JIE
15 granted patents·9 pending applications·34 citations·filing 2016–2025
89Inventor score
Top patents by PatentIndex Score
24 records- 0197US10670973B2Coloring aware optimizationASML NETHERLANDS BV·Filed 2016·Granted Jun 2, 2020·16 cites·20 claims
- 0293US11561477B2Training methods for machine learning assisted optical proximity error correctionASML NETHERLANDS BV·Filed 2018·Granted Jan 24, 2023·4 cites·20 claims
- 0391US12038694B2Determining pattern ranking based on measurement feedback from printed substrateASML NETHERLANDS BV·Filed 2023·Granted Jul 16, 2024·1 cites·20 claims
- 0490US12204250B2Training methods for machine learning assisted optical proximity errorASML NETHERLANDS BV·Filed 2023·Granted Jan 21, 2025·1 cites·20 claims
- 0589US11768440B2Training methods for machine learning assisted optical proximity error correctionASML NETHERLANDS BV·Filed 2022·Granted Sep 26, 2023·1 cites·11 claims
- 0688US11232249B2Method for determining curvilinear patterns for patterning deviceASML NETHERLANDS BV·Filed 2019·Granted Jan 25, 2022·5 cites·20 claims
- 0786US11443083B2Identification of hot spots or defects by machine learningASML NETHERLANDS BV·Filed 2017·Granted Sep 13, 2022·2 cites·20 claims
- 0885US2025341785A1Identification of hot spots or defects by machine learningASML NETHERLANDS BV·Filed 2025·Application pending·0 cites
- 0982US12399423B2Method for training machine learning model to determine optical proximity correction for maskASML NETHERLANDS BV·Filed 2020·Granted Aug 26, 2025·2 cites·20 claims
- 1080US2025370327A1Method for training machine learning model to determine optical proximity correction for maskASML NETHERLANDS BV·Filed 2025·Application pending·0 cites
- 1175US12360461B2Identification of hot spots or defects by machine learningASML NETHERLANDS BV·Filed 2022·Granted Jul 15, 2025·0 cites·20 claims
- 1271US11734490B2Method for determining curvilinear patterns for patterning deviceASML NETHERLANDS BV·Filed 2021·Granted Aug 22, 2023·0 cites·22 claims
- 1369US10326250B2Method for expanding tuning range of all-solid-state continuous-wave single frequency laserUNIV SHANXI·Filed 2018·Granted Jun 18, 2019·2 cites·8 claims
- 1464US11635699B2Determining pattern ranking based on measurement feedback from printed substrateASML NETHERLANDS BV·Filed 2019·Granted Apr 25, 2023·0 cites·20 claims
- 1560US2024353735A1Single-frequency continuous-wave optical parametric oscillatorUNIV SHANXI·Filed 2024·Application pending·0 cites
- 1660US2024120701A1All-solid-state single-frequency continuous wave laserUNIV SHANXI·Filed 2023·Application pending·0 cites
- 1753US2025044710A1Overlay metrology based on template matching with adaptive weightingASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 1850US11404840B2Device and method for measuring thermal load caused by excited state absorption in laser gain crystalUNIV SHANXI·Filed 2020·Granted Aug 2, 2022·0 cites·20 claims
- 1950US2022335333A1Methods for generating characteristic pattern and training machine learning modelASML NETHERLANDS BV·Filed 2020·Application pending·0 cites
- 2048US11127160B2Object characteristic locating device and laser and imaging integration systemUNIV NATIONAL CHIAO TUNG·Filed 2020·Granted Sep 21, 2021·0 cites·6 claims
- 2147US11916349B2Device and method for measuring thermal load caused by energy transfer upconversion in laser gain crystalUNIV SHANXI·Filed 2020·Granted Feb 27, 2024·0 cites·12 claims
- 2244US2022291590A1Modeling method for computational fingerprintsASML NETHERLANDS BV·Filed 2020·Application pending·0 cites
- 2341US2020380362A1Methods for training machine learning model for computation lithographyASML NETHERLANDS BV·Filed 2019·Application pending·0 cites
- 2440US2020050099A1Assist feature placement based on machine learningASML NETHERLANDS BV·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →