Inventor · disambiguated record
Jiuun-Jer Yang
Also filed as: YANG JIUUN-JER
7 granted patents·118 citations·filing 1996–2014
85Inventor score
Files withWINBOND ELECTRONICS CORP3SEMICONDUCTOR MFG INT SHANGHAI1TAIWAN SEMICONDUCTOR MFG CORP1WORLDWIDE SEMICONDUCTOR MANUFA1YANG JIUUN-JER1
Top patents by PatentIndex Score
7 records- 0177US6051482AMethod for manufacturing buried-channel PMOSWINBOND ELECTRONICS CORP·Filed 1998·Granted Apr 18, 2000·57 cites·49 claims
- 0262US8796685B2On-chip plasma charging sensorYANG JIUUN-JER·Filed 2011·Granted Aug 5, 2014·2 cites·13 claims
- 0359US5763285AProcess for controlling gate/drain overlapped length in lightly-doped drain (LDD) structuresWINBOND ELECTRONICS CORP·Filed 1996·Granted Jun 9, 1998·21 cites·16 claims
- 0454US6215156B1Electrostatic discharge protection device with resistive drain structureTAIWAN SEMICONDUCTOR MFG CORP·Filed 1999·Granted Apr 10, 2001·17 cites·4 claims
- 0552US9299622B2On-chip plasma charging sensorSEMICONDUCTOR MFG INT SHANGHAI·Filed 2014·Granted Mar 29, 2016·0 cites·12 claims
- 0644US6040603AElectrostatic discharge protection circuit employing MOSFETs having double ESD implantationsWORLDWIDE SEMICONDUCTOR MANUFA·Filed 1999·Granted Mar 21, 2000·10 cites·1 claims
- 0738US6051984AWafer-level method of hot-carrier reliability test for semiconductor wafersWINBOND ELECTRONICS CORP·Filed 1997·Granted Apr 18, 2000·11 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →