Inventor · disambiguated record
Jian Zhao
Also filed as: ZHAO JIAN · ZHAO JIAN H · ZHAO JIAN HUI
9 granted patents·5 pending applications·171 citations·filing 1993–2022
88Inventor score
Top patents by PatentIndex Score
14 records- 0192US7479672B2Power junction field effect power transistor with highly vertical channel and uniform channel openingUNIV RUTGERS·Filed 2007·Granted Jan 20, 2009·28 cites·20 claims
- 0285US6107649AField-controlled high-power semiconductor devicesUNIV RUTGERS·Filed 1998·Granted Aug 22, 2000·65 cites·41 claims
- 0384US9544982B2NozzleASML NETHERLANDS BV·Filed 2014·Granted Jan 10, 2017·5 cites·19 claims
- 0483US6841812B2Double-gated vertical junction field effect power transistorUNITED SILICON CARBIDE INC·Filed 2002·Granted Jan 11, 2005·36 cites·8 claims
- 0556US5323030AField effect real space transistorUS ARMY·Filed 1993·Granted Jun 21, 1994·17 cites·8 claims
- 0655US2025343019A1Ultraviolet cathode ray tubeSHANGHAI JIYOUWEI OPTOELECTRONICS TECH CO LTD·Filed 2022·Application pending·0 cites
- 0754US5569943AField effect real space transistorUS ARMY·Filed 1995·Granted Oct 29, 1996·15 cites·15 claims
- 0850US2010148224A1Power junction field effect power transistor with highly vertical channel and uniform channel openingUNIV RUTGERS·Filed 2009·Application pending·0 cites
- 0942US10053921B2Contact pressure limitationGE OIL & GAS UK LTD·Filed 2015·Granted Aug 21, 2018·0 cites·20 claims
- 1041US7763829B2Ceramic heater-type glow plugBOSCH CORP·Filed 2004·Granted Jul 27, 2010·1 cites·11 claims
- 1140US2008006850A1System and method for forming through wafer vias using reverse pulse platingINNOVATIVE MICRO TECHNOLOGY·Filed 2006·Application pending·0 cites
- 1238US2014232994A1Low power laser CRT and projection system based on parallel flow electron gunXIA ZHONGPING·Filed 2012·Application pending·0 cites
- 1336US2005067630A1Vertical junction field effect power transistorFiled 2003·Application pending·0 cites
- 1430US5291041AAlGaAs/GaAs thyristorUS ARMY·Filed 1993·Granted Mar 1, 1994·4 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →