Inventor · disambiguated record
John D. Alexander
Also filed as: ALEXANDER JOHN · ALEXANDER JOHN D · ALEXANDER JOHN DAVID
10 granted patents·481 citations·filing 1992–2014
92Inventor score
Files withPARK SCIENT INSTR4ALEXANDER JOHN D1KLA TENCOR TECH CORP1NT MDT DEV INC1THERMO MICROSCOPES CORP1
Top patents by PatentIndex Score
10 records- 0196US5376790AScanning probe microscopePARK SCIENT INSTR·Filed 1992·Granted Dec 27, 1994·197 cites·57 claims
- 0285US9110092B1Scanning probe based apparatus and methods for low-force profiling of sample surfaces and detection and mapping of local mechanical and electromagnetic properties in non-resonant oscillatory modeNT MDT DEV INC·Filed 2014·Granted Aug 18, 2015·15 cites·10 claims
- 0384US5496999AScanning probe microscopeFiled 1994·Granted Mar 5, 1996·56 cites·42 claims
- 0481US5811821ASingle axis vibration reducing systemPARK SCIENT INSTR·Filed 1996·Granted Sep 22, 1998·64 cites·22 claims
- 0579US6794886B1Tank probe for measuring surface conductanceKLA TENCOR TECH CORP·Filed 2002·Granted Sep 21, 2004·24 cites·22 claims
- 0673US5952657AAtomic force microscope with integrated optics for attachment to optical microscopeTHERMO MICROSCOPES CORP·Filed 1997·Granted Sep 14, 1999·54 cites·40 claims
- 0770US6130427AScanning probe microscope with multimode headPARK SCIENT INSTR·Filed 1997·Granted Oct 10, 2000·24 cites·35 claims
- 0869US8087289B2High resolution surface potential microscopeALEXANDER JOHN D·Filed 2008·Granted Jan 3, 2012·4 cites·20 claims
- 0961US5861624AAtomic force microscope for attachment to optical microscopePARK SCIENT INSTR·Filed 1997·Granted Jan 19, 1999·31 cites·61 claims
- 1048US6005251AVoice coil scanner for use in scanning probe microscopeTHERMOMICROSCOPES CORP·Filed 1998·Granted Dec 21, 1999·12 cites·30 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →