Inventor · disambiguated record
Joachim Baumann
Also filed as: BAUMANN JOACHIM · BAUMANN JOACHIM F
16 granted patents·2 pending applications·703 citations·filing 1986–2012
95Inventor score
Top patents by PatentIndex Score
18 records- 0198US7564941B2Focus-detector arrangement for generating projective or tomographic phase contrast recordings with X-ray optical gratingsSIEMENS AG·Filed 2007·Granted Jul 21, 2009·83 cites·19 claims
- 0296US7440542B2Method and measuring arrangement for nondestructive analysis of an examination object by means of x-radiationSIEMENS AG·Filed 2007·Granted Oct 21, 2008·43 cites·42 claims
- 0395US7057176B2System and method for multiple mode flexible excitation in sonic infrared imagingSIEMENS POWER GENERATION INC·Filed 2005·Granted Jun 6, 2006·28 cites·20 claims
- 0494US7653177B2Measurement system and method for the noninvasive determination of properties of an object to be examined and contrast medium X-ray phase-contrast measurementSIEMENS AG·Filed 2008·Granted Jan 26, 2010·22 cites·22 claims
- 0594US7485882B2Hand held magnetic induction thermography systemSIEMENS ENERGY INC·Filed 2006·Granted Feb 3, 2009·36 cites·14 claims
- 0692US7639786B2X-ray optical transmission grating of a focus-detector arrangement of an X-ray apparatus for generating projective or tomographic phase contrast recordings of a subjectSIEMENS AG·Filed 2007·Granted Dec 29, 2009·106 cites·18 claims
- 0791US7486770B2Focus-detector arrangement of an X-ray apparatus for generating projective or tomographic phase contrast recordingsSIEMENS AG·Filed 2007·Granted Feb 3, 2009·89 cites·53 claims
- 0890US7817777B2Focus detector arrangement and method for generating contrast x-ray imagesSIEMENS AG·Filed 2006·Granted Oct 19, 2010·82 cites·39 claims
- 0988US7453981B2Focus-detector arrangement with X-ray optical grating for phase contrast measurementSIEMENS AG·Filed 2007·Granted Nov 18, 2008·62 cites·30 claims
- 1088US7433444B2Focus-detector arrangement of an X-ray apparatus for generating projective or tomographic phase contrast recordingsSIEMENS AG·Filed 2007·Granted Oct 7, 2008·66 cites·16 claims
- 1177US7003373B2Method and device for numerical controlSIEMENS AG·Filed 2003·Granted Feb 21, 2006·24 cites·19 claims
- 1268US6357301B1Method and device for measuring the tensile stress distribution in a metal stripSIEMENS AG·Filed 1999·Granted Mar 19, 2002·12 cites·9 claims
- 1359US6812468B1Thermal-wave measuring methodSIEMENS AG·Filed 1999·Granted Nov 2, 2004·23 cites·10 claims
- 1456US4719808ATemperature-compensated ultrasonic measurement of wall thicknessSIEMENS AG·Filed 1986·Granted Jan 19, 1988·17 cites·5 claims
- 1541US2007153979A1X-ray system having an x-ray generator that produces an x-ray focal spot with multiple intensity maximaBAUMANN JOACHIM·Filed 2006·Application pending·0 cites
- 1640US6289750B1Device for measuring tensile stress distribution in a metal stripSIEMENS AG·Filed 1998·Granted Sep 18, 2001·10 cites·17 claims
- 1738US2009046758A1Induction Thermography Test StandBAUMANN JOACHIM·Filed 2008·Application pending·0 cites
- 1837US8788231B2Method for detecting the rotation and direction of rotation of a rotorBAUMANN JOACHIM·Filed 2012·Granted Jul 22, 2014·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →