Inventor · disambiguated record
Jon Daley
Also filed as: DALEY JON · DALEY JON P
35 granted patents·4 pending applications·245 citations·filing 2003–2024
97Inventor score
Files withMICRON TECHNOLOGY INC25DALEY JON5SEMICONDUCTOR COMPONENTS IND LLC4LIU JUN2APTINA IMAGING CORP1
Top patents by PatentIndex Score
39 records- 0196US7800092B2Phase change memory elements using energy conversion layers, memory arrays and systems including same, and methods of making and usingMICRON TECHNOLOGY INC·Filed 2006·Granted Sep 21, 2010·38 cites·31 claims
- 0295US7711259B2Method and apparatus for increasing depth of field for an imagerAPTINA IMAGING CORP·Filed 2006·Granted May 4, 2010·29 cites·33 claims
- 0393US7709885B2Access transistor for memory deviceMICRON TECHNOLOGY INC·Filed 2007·Granted May 4, 2010·20 cites·9 claims
- 0491US7433227B2Resistance variable memory device with sputtered metal-chalcogenide region and method of fabricationMICRON TECHNOLOGY INC·Filed 2007·Granted Oct 7, 2008·14 cites·13 claims
- 0589US7701760B2Resistance variable memory device with sputtered metal-chalcogenide region and method of fabricationMICRON TECHNOLOGY INC·Filed 2008·Granted Apr 20, 2010·13 cites·20 claims
- 0688US7274034B2Resistance variable memory device with sputtered metal-chalcogenide region and method of fabricationMICRON TECHNOLOGY INC·Filed 2005·Granted Sep 25, 2007·12 cites·23 claims
- 0787US7687406B2Methods of eliminating pattern collapse on photoresist patternsMICRON TECHNOLOGY INC·Filed 2006·Granted Mar 30, 2010·8 cites·10 claims
- 0887US7277313B2Resistance variable memory element with threshold device and method of forming the sameMICRON TECHNOLOGY INC·Filed 2005·Granted Oct 2, 2007·16 cites·38 claims
- 0986US7579615B2Access transistor for memory deviceMICRON TECHNOLOGY INC·Filed 2005·Granted Aug 25, 2009·10 cites·13 claims
- 1085US7289349B2Resistance variable memory element with threshold device and method of forming the sameMICRON TECHNOLOGY INC·Filed 2006·Granted Oct 30, 2007·14 cites·21 claims
- 1185US7233520B2Process for erasing chalcogenide variable resistance memory bitsMICRON TECHNOLOGY INC·Filed 2005·Granted Jun 19, 2007·14 cites·29 claims
- 1282US8956981B2Methods of eliminating pattern collapse on photoresist patternsMICRON TECHNOLOGY INC·Filed 2013·Granted Feb 17, 2015·3 cites·4 claims
- 1381US7427770B2Memory array for increased bit densityMICRON TECHNOLOGY INC·Filed 2005·Granted Sep 23, 2008·5 cites·39 claims
- 1479US8552538B2Methods of eliminating pattern collapse on photoresist patternsDALEY JON·Filed 2010·Granted Oct 8, 2013·3 cites·10 claims
- 1579US7709289B2Memory elements having patterned electrodes and method of forming the sameMICRON TECHNOLOGY INC·Filed 2005·Granted May 4, 2010·5 cites·22 claims
- 1676US8252622B2Phase change current density control structureDALEY JON·Filed 2011·Granted Aug 28, 2012·2 cites·26 claims
- 1775US7943921B2Phase change current density control structureMICRON TECHNOLOGY INC·Filed 2005·Granted May 17, 2011·4 cites·19 claims
- 1875US7940556B2Resistance variable memory device with sputtered metal-chalcogenide region and method of fabricationMICRON TECHNOLOGY INC·Filed 2010·Granted May 10, 2011·2 cites·20 claims
- 1974US8241947B2Phase change memory elements using energy conversion layers, memory arrays and systems including same, and methods of making and using sameLIU JUN·Filed 2010·Granted Aug 14, 2012·3 cites·18 claims
- 2074US7119025B2Methods of eliminating pattern collapse on photoresist patternsMICRON TECHNOLOGY INC·Filed 2004·Granted Oct 10, 2006·11 cites·17 claims
- 2170US7115532B2Methods of forming patterned photoresist layers over semiconductor substratesMICRON TECHNOLGOY INC·Filed 2003·Granted Oct 3, 2006·10 cites·75 claims
- 2269US2025390023A1Overlapping reticle placement for lithographic fabrication of a dieSEMICONDUCTOR COMPONENTS IND LLC·Filed 2024·Application pending·0 cites
- 2362US8847193B2Phase change current density control structureDALEY JON·Filed 2013·Granted Sep 30, 2014·0 cites·12 claims
- 2462US7119031B2Methods of forming patterned photoresist layers over semiconductor substratesMICRON TECHNOLOGY INC·Filed 2004·Granted Oct 10, 2006·6 cites·64 claims
- 2562US2025324783A1Image Sensor with Visible Light and Short Wave Infrared DetectionSEMICONDUCTOR COMPONENTS IND LLC·Filed 2024·Application pending·0 cites
- 2661US2025113629A1Image sensor charge direction structures and methodsSEMICONDUCTOR COMPONENTS IND LLC·Filed 2023·Application pending·0 cites
- 2759US9147838B2Phase change current density control structureMICRON TECHNOLOGY INC·Filed 2014·Granted Sep 29, 2015·0 cites·30 claims
- 2859US8546784B2Phase change current density control structureDALEY JON·Filed 2012·Granted Oct 1, 2013·0 cites·22 claims
- 2954US8659002B2Phase change memory elements using energy conversion layers, memory arrays and systems including same, and methods of making and using sameLIU JUN·Filed 2012·Granted Feb 25, 2014·0 cites·21 claims
- 3054US7985698B2Methods of forming patterned photoresist layers over semiconductor substratesMICRON TECHNOLOGY INC·Filed 2006·Granted Jul 26, 2011·0 cites·25 claims
- 3154US7643333B2Process for erasing chalcogenide variable resistance memory bitsMICRON TECHNOLOGY INC·Filed 2007·Granted Jan 5, 2010·2 cites·29 claims
- 3253US7700422B2Methods of forming memory arrays for increased bit densityMICRON TECHNOLOGY INC·Filed 2006·Granted Apr 20, 2010·0 cites·15 claims
- 3352US7368399B2Methods of forming patterned photoresist layers over semiconductor substratesMICRON TECHNOLOGY INC·Filed 2006·Granted May 6, 2008·0 cites·31 claims
- 3451US7663133B2Memory elements having patterned electrodes and method of forming the sameMICRON TECHNOLOGY INC·Filed 2006·Granted Feb 16, 2010·0 cites·23 claims
- 3549US7968927B2Memory array for increased bit density and method of forming the sameMICRON TECHNOLOGY INC·Filed 2010·Granted Jun 28, 2011·0 cites·19 claims
- 3648US8652903B2Access transistor for memory deviceDALEY JON·Filed 2010·Granted Feb 18, 2014·0 cites·18 claims
- 3746US8334221B2Methods of forming patterned photoresist layers over semiconductor substratesDALEY JON P·Filed 2011·Granted Dec 18, 2012·0 cites·36 claims
- 3846US7269044B2Method and apparatus for accessing a memory arrayMICRON TECHNOLOGY INC·Filed 2005·Granted Sep 11, 2007·1 cites·38 claims
- 3945US2020052024A1Semiconductor sensors with charge dissipation layer and related methodsSEMICONDUCTOR COMPONENTS IND LLC·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →