Inventor · disambiguated record
Joel Estrella
Also filed as: ESTRELLA JOEL
8 granted patents·2 pending applications·16 citations·filing 2018–2024
78Inventor score
Files withTOKYO ELECTRON LTD10
Top patents by PatentIndex Score
10 records- 0193US10622233B2Amelioration of global wafer distortion based on determination of localized distortions of a semiconductor waferTOKYO ELECTRON LTD·Filed 2018·Granted Apr 14, 2020·14 cites·20 claims
- 0286US11738363B2Bath systems and methods thereofTOKYO ELECTRON LTD·Filed 2021·Granted Aug 29, 2023·1 cites·19 claims
- 0380US12226796B2Bath systems and methods thereofTOKYO ELECTRON LTD·Filed 2023·Granted Feb 18, 2025·0 cites·20 claims
- 0479US2025196175A1Bath systems and methods thereofTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 0572US11346882B2Enhancement of yield of functional microelectronic devicesTOKYO ELECTRON LTD·Filed 2018·Granted May 31, 2022·1 cites·21 claims
- 0664US12488452B2Wafer bath imagingTOKYO ELECTRON LTD·Filed 2021·Granted Dec 2, 2025·0 cites·18 claims
- 0757US11276157B2Systems and methods for automated video analysis detection techniques for substrate processTOKYO ELECTRON LTD·Filed 2020·Granted Mar 15, 2022·0 cites·19 claims
- 0857US2025308960A1Apparatus and method for detecting and monitoring objects in a fluid bath and adjusting the fluid bath based on the measured object propertiesTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 0956US11637031B2Systems and methods for spin process video analysis during substrate processingTOKYO ELECTRON LTD·Filed 2020·Granted Apr 25, 2023·0 cites·19 claims
- 1054US11435393B2Enhancement of yield of functional microelectronic devicesTOKYO ELECTRON LTD·Filed 2018·Granted Sep 6, 2022·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →