Inventor · disambiguated record
John Flanagan
Also filed as: FLANAGAN IV JOHN F · FLANAGAN IV JOHN FRANCIS · FLANAGAN JOHN
7 granted patents·4 pending applications·15 citations·filing 2016–2025
76Inventor score
Files withFEI CO11
Top patents by PatentIndex Score
11 records- 0189US9978557B2System for orienting a sample using a diffraction patternFEI CO·Filed 2016·Granted May 22, 2018·11 cites·20 claims
- 0279US11176656B2Artificial intelligence-enabled preparation end-pointingFEI CO·Filed 2019·Granted Nov 16, 2021·2 cites·22 claims
- 0377US2025259310A1Artificial intelligence enabled metrologyFEI CO·Filed 2025·Application pending·0 cites
- 0474US12293525B2Artificial intelligence enabled metrologyFEI CO·Filed 2022·Granted May 6, 2025·0 cites·15 claims
- 0569US11151356B2Using convolution neural networks for on-the-fly single particle reconstructionFEI CO·Filed 2019·Granted Oct 19, 2021·2 cites·15 claims
- 0668US11847813B2Artificial intelligence-enabled preparation end-pointingFEI CO·Filed 2021·Granted Dec 19, 2023·0 cites·22 claims
- 0764US12362137B2Automated sample alignment for microscopyFEI CO·Filed 2022·Granted Jul 15, 2025·0 cites·20 claims
- 0856US2020134829A1Artificial Intelligence Enabled MetrologyFEI CO·Filed 2018·Application pending·0 cites
- 0955US11569056B2Parameter estimation for metrology of features in an imageFEI CO·Filed 2019·Granted Jan 31, 2023·0 cites·18 claims
- 1052US2024071051A1Automated Selection And Model Training For Charged Particle Microscope ImagingFEI CO·Filed 2022·Application pending·0 cites
- 1145US2021088770A1Pose estimation using sematic segmentationFEI CO·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →