Inventor · disambiguated record
John M Freeseman
Also filed as: FREESEMAN JOHN · FREESEMAN JOHN M
10 granted patents·236 citations·filing 2000–2006
91Inventor score
Top patents by PatentIndex Score
10 records- 0191US6671844B1Memory tester tests multiple DUT's per test siteAGILENT TECHNOLOGIES INC·Filed 2000·Granted Dec 30, 2003·73 cites·2 claims
- 0283US6834364B2Algorithmically programmable memory tester with breakpoint trigger, error jamming and 'scope mode that memorizes target sequencesAGILENT TECHNOLOGIES INC·Filed 2001·Granted Dec 21, 2004·39 cites·10 claims
- 0382US6591385B1Method and apparatus for inserting programmable latency between address and data information in a memory testerAGILENT TECHNOLOGIES INC·Filed 2000·Granted Jul 8, 2003·33 cites·15 claims
- 0477US6748562B1Memory tester omits programming of addresses in detected bad columnsAGILENT TECHNOLOGIES INC·Filed 2000·Granted Jun 8, 2004·28 cites·2 claims
- 0572US6763490B1Method and apparatus for coordinating program execution in a site controller with pattern execution in a testerAGILENT TECHNOLOGIES INC·Filed 2000·Granted Jul 13, 2004·20 cites·21 claims
- 0669US6687855B1Apparatus and method for storing information during a test programAGILENT TECHNOLOGIES INC·Filed 2000·Granted Feb 3, 2004·15 cites·20 claims
- 0767US7339844B2Memory device fail summary data reduction for improved redundancy analysisVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Mar 4, 2008·5 cites·8 claims
- 0859US6687861B1Memory tester with enhanced post decodeAGILENT TECHNOLOGIES INC·Filed 2000·Granted Feb 3, 2004·13 cites·2 claims
- 0954US6973404B1Method and apparatus for administering inversion property in a memory testerAGILENT TECHNOLOGIES INC·Filed 2000·Granted Dec 6, 2005·6 cites·14 claims
- 1048US7231573B2Delay management systemVERIGY PTE LTD·Filed 2002·Granted Jun 12, 2007·4 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →