Inventor · disambiguated record
John K. Gritters
Also filed as: GRITTERS JOHN · GRITTERS JOHN K · GRITTERS JOHN KIRK
22 granted patents·7 pending applications·280 citations·filing 2002–2025
95Inventor score
Top patents by PatentIndex Score
29 records- 0195US9702904B2Non-linear vertical leaf springBREINLINGER KEITH J·Filed 2011·Granted Jul 11, 2017·19 cites·28 claims
- 0295US7872394B1MEMS device with two axes comb drive actuatorsGRITTERS JOHN·Filed 2002·Granted Jan 18, 2011·116 cites·8 claims
- 0394US11810971B2Integrated design for III-Nitride devicesTRANSPHORM TECH INC·Filed 2020·Granted Nov 7, 2023·3 cites·13 claims
- 0494US7674112B2Resilient contact element and methods of fabricationFORMFACTOR INC·Filed 2006·Granted Mar 9, 2010·29 cites·16 claims
- 0591US8130007B2Probe card assembly with carbon nanotube probes having a spring mechanism thereinELDRIDGE BENJAMIN N·Filed 2007·Granted Mar 6, 2012·21 cites·15 claims
- 0691US7628620B2Reinforced contact elementsFORMFACTOR INC·Filed 2008·Granted Dec 8, 2009·16 cites·37 claims
- 0791US7579856B2Probe structures with physically suspended electronic componentsFORMFACTOR INC·Filed 2006·Granted Aug 25, 2009·21 cites·18 claims
- 0885US8148646B2Process of positioning groups of contact structuresFAN LI·Filed 2008·Granted Apr 3, 2012·13 cites·10 claims
- 0984US11322599B2Enhancement mode III-nitride devices having an Al1-xSixO gate insulatorTRANSPHORM TECH INC·Filed 2017·Granted May 3, 2022·4 cites·22 claims
- 1080US12324180B2Integrated design for III-Nitride devicesTRANSPHORM TECH INC·Filed 2023·Granted Jun 3, 2025·0 cites·14 claims
- 1180US2025275168A1Integrated design for iii-nitride devicesTRANSPHORM TECH INC·Filed 2025·Application pending·0 cites
- 1279US7782072B2Single support structure probe group with staggered mounting patternFORMFACTOR INC·Filed 2006·Granted Aug 24, 2010·5 cites·9 claims
- 1379US7731503B2Carbon nanotube contact structuresFORMFACTOR INC·Filed 2006·Granted Jun 8, 2010·9 cites·18 claims
- 1477US8872176B2Elastic encapsulated carbon nanotube based electrical contactsFANG TRELIANT·Filed 2011·Granted Oct 28, 2014·5 cites·27 claims
- 1571US8203352B2Single support structure probe group with staggered mounting patternFAN LI·Filed 2010·Granted Jun 19, 2012·2 cites·26 claims
- 1668US7688085B2Contactor having a global spring structure and methods of making and using the contactorFORMFACTOR INC·Filed 2006·Granted Mar 30, 2010·5 cites·25 claims
- 1767US8691099B2Process for fabricating MEMS devicesGRITTERS JOHN·Filed 2011·Granted Apr 8, 2014·3 cites·14 claims
- 1865US7528618B2Extended probe tipsFORMFACTOR INC·Filed 2006·Granted May 5, 2009·4 cites·15 claims
- 1964US8138859B2Switch for use in microelectromechanical systems (MEMS) and MEMS devices incorporating sameGRITTERS JOHN K·Filed 2008·Granted Mar 20, 2012·4 cites·24 claims
- 2062US8756802B2Carbon nanotube contact structures for use with semiconductor dies and other electronic devicesFORMFACTOR INC·Filed 2012·Granted Jun 24, 2014·1 cites·12 claims
- 2153US7384277B1Reinforced contact elementsFORMFACTOR INC·Filed 2006·Granted Jun 10, 2008·0 cites·21 claims
- 2253US2010154861A1Printed solar panelFORMFACTOR INC·Filed 2008·Application pending·0 cites
- 2352US8697301B2Fuel cell using carbon nanotubesELDRIDGE BENJAMIN N·Filed 2011·Granted Apr 15, 2014·0 cites·23 claims
- 2451US2010252317A1Carbon nanotube contact structures for use with semiconductor dies and other electronic devicesFORMFACTOR INC·Filed 2009·Application pending·0 cites
- 2547US2010140793A1Process For Manufacturing Contact Elements For Probe Card AssemblesFORMFACTOR INC·Filed 2009·Application pending·0 cites
- 2644US8115504B2Microspring array having reduced pitch contact elementsGRITTERS JOHN K·Filed 2008·Granted Feb 14, 2012·0 cites·30 claims
- 2740US2007152685A1A probe array structure and a method of making a probe array structureFORMFACTOR INC·Filed 2006·Application pending·0 cites
- 2839US2009079455A1Reduced scrub contact elementFORMFACTOR INC·Filed 2007·Application pending·0 cites
- 2937US2006132153A1Assembly with a detachable memberFORMFACTOR INC·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →