Inventor · disambiguated record
John W. Hadd
Also filed as: HADD JOHN · HADD JOHN W
2 granted patents·1 pending application·4 citations·filing 2009–2016
45Inventor score
Top patents by PatentIndex Score
3 records- 0167US10345211B2Method of determining a concentration of a material not dissolved by silicon etchants contaminating a productHEMLOCK SEMICONDUCTOR CORP·Filed 2016·Granted Jul 9, 2019·1 cites·18 claims
- 0261US9261464B2Applying edge-on photoluminescence to measure bulk impurities of semiconductor materialsKRESZOWSKI DOUG·Filed 2011·Granted Feb 16, 2016·3 cites·15 claims
- 0339US2011228268A1Method Of Analyzing A Composition Containing ImpuritiesHADD JOHN·Filed 2009·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →