Inventor · disambiguated record
Jovan Jovanovic
Also filed as: JOVANOVIC JOVAN
56 granted patents·16 pending applications·575 citations·filing 2002–2025
99Inventor score
Files withAEHR TEST SYSTEMS60RICHMOND II DONALD P4INCODE TECH INC3LINDSEY SCOTT E3AEHR Test Ststems1
Top patents by PatentIndex Score
72 records- 0198US11977098B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2023·Granted May 7, 2024·5 cites·22 claims
- 0298US11592465B2Pressure relief valveAEHR TEST SYSTEMS·Filed 2021·Granted Feb 28, 2023·13 cites·11 claims
- 0398US11255903B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2020·Granted Feb 22, 2022·12 cites·11 claims
- 0498US11112429B2Pressure relief valveAEHR TEST SYSTEMS·Filed 2019·Granted Sep 7, 2021·18 cites·8 claims
- 0598US10401385B2Limiting translation for consistent substrate-to-substrate contactAEHR TEST SYSTEMS·Filed 2017·Granted Sep 3, 2019·20 cites·20 claims
- 0698US9625521B2Controlling alignment during a thermal cycleAEHR TEST SYSTEMS·Filed 2014·Granted Apr 18, 2017·23 cites·5 claims
- 0797US12007451B2Method and system for thermal control of devices in an electronics testerAEHR TEST SYSTEMS·Filed 2021·Granted Jun 11, 2024·2 cites·15 claims
- 0897US9880197B2Controlling alignment during a thermal cycleAEHR TEST SYSTEMS·Filed 2017·Granted Jan 30, 2018·21 cites·10 claims
- 0997US9316683B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2015·Granted Apr 19, 2016·19 cites·10 claims
- 1097US8506335B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2013·Granted Aug 13, 2013·31 cites·6 claims
- 1197US8228085B2System for testing an integrated circuit of a device and its method of useLINDSEY SCOTT E·Filed 2010·Granted Jul 24, 2012·26 cites·22 claims
- 1297US8030957B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2009·Granted Oct 4, 2011·42 cites·14 claims
- 1396US12292484B2Method and system for thermal control of devices in an electronics testerAEHR TEST SYSTEMS·Filed 2024·Granted May 6, 2025·1 cites·20 claims
- 1496US11448695B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2020·Granted Sep 20, 2022·3 cites·35 claims
- 1596US9250291B2System for testing an integrated circuit of a device and its method of useLINDSEY SCOTT E·Filed 2012·Granted Feb 2, 2016·19 cites·22 claims
- 1696US8947116B2System for testing an integrated circuit of a device and its method of useLINDSEY SCOTT E·Filed 2011·Granted Feb 3, 2015·22 cites·12 claims
- 1796US8628336B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2013·Granted Jan 14, 2014·26 cites·11 claims
- 1896US7762822B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2006·Granted Jul 27, 2010·29 cites·37 claims
- 1995US11835575B2Electronics testerAEHR TEST SYSTEMS·Filed 2021·Granted Dec 5, 2023·11 cites·26 claims
- 2095US7800382B2System for testing an integrated circuit of a device and its method of useAEHR Test Ststems·Filed 2007·Granted Sep 21, 2010·40 cites·26 claims
- 2194US8388357B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2012·Granted Mar 5, 2013·12 cites·58 claims
- 2294US8118618B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2010·Granted Feb 21, 2012·13 cites·59 claims
- 2393US7969175B2Separate test electronics and blower modules in an apparatus for testing an integrated circuitAEHR TEST SYSTEMS·Filed 2009·Granted Jun 28, 2011·27 cites·81 claims
- 2492US2025085337A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2592US2025085338A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2691US6853209B1Contactor assembly for testing electrical circuitsAEHR TEST SYSTEMS·Filed 2002·Granted Feb 8, 2005·42 cites·14 claims
- 2791US2024393387A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2891US2024402243A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2991US2025093398A1Electronics testerAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 3091US2025093399A1Electronics testerAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 3191US2024393388A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 3291US2024410938A1System for testing an integrated circuit of a device and itsmethod of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 3390US12265136B2Method and system for thermal control of devices in electronics testerAEHR TEST SYSTEMS·Filed 2024·Granted Apr 1, 2025·0 cites·9 claims
- 3490US6867608B2Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test componentAEHR TEST SYSTEMS·Filed 2002·Granted Mar 15, 2005·32 cites·13 claims
- 3589US12298328B2Controlling alignment during a thermal cycleAEHR TEST SYSTEMS·Filed 2024·Granted May 13, 2025·0 cites·16 claims
- 3689US12163999B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2023·Granted Dec 10, 2024·0 cites·22 claims
- 3788US12169217B2Electronics testerAEHR TEST SYSTEMS·Filed 2023·Granted Dec 17, 2024·0 cites·10 claims
- 3888US2024302451A1Method and system for thermal control of devices in an electronics testerAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 3986US2025138086A1Electronics testerAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 4085US12282062B2Electronics testerAEHR TEST SYSTEMS·Filed 2024·Granted Apr 22, 2025·0 cites·30 claims
- 4185US12253560B2Electronics testerAEHR TEST SYSTEMS·Filed 2024·Granted Mar 18, 2025·0 cites·25 claims
- 4285US11821940B2Electronics testerAEHR TEST SYSTEMS·Filed 2023·Granted Nov 21, 2023·0 cites·9 claims
- 4384US2025224423A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2025·Application pending·0 cites
- 4483US12326472B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2022·Granted Jun 10, 2025·0 cites·12 claims
- 4583US9151797B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2014·Granted Oct 6, 2015·2 cites·6 claims
- 4682US8747123B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2013·Granted Jun 10, 2014·2 cites·5 claims
- 4781US12228609B2Electronics testerAEHR TEST SYSTEMS·Filed 2023·Granted Feb 18, 2025·0 cites·45 claims
- 4881US11860221B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2022·Granted Jan 2, 2024·0 cites·12 claims
- 4980US11635459B2Electronics testerAEHR TEST SYSTEMS·Filed 2021·Granted Apr 25, 2023·0 cites·9 claims
- 5080US10649022B2Electronics testerAEHR TEST SYSTEMS·Filed 2018·Granted May 12, 2020·1 cites·13 claims
Showing the top 50 of 72 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →