Inventor · disambiguated record
Jörn Kamps
Also filed as: KAMPS JOERN · KAMPS JÖRN
2 granted patents·8 citations·filing 2002–2007
54Inventor score
Top patents by PatentIndex Score
2 records- 0150US6998602B2Method of and an apparatus for measuring a specimen by means of a scanning probe microscopeJPK INSTRUMENTS AG·Filed 2002·Granted Feb 14, 2006·6 cites·11 claims
- 0236US9063335B2Apparatus and method for examining a specimen by means of probe microscopySOMMER GUNNAR·Filed 2007·Granted Jun 23, 2015·2 cites·34 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →