Inventor · disambiguated record
Joerg Kiesewetter
Also filed as: KIESEWETTER JOERG
7 granted patents·2 pending applications·31 citations·filing 2005–2013
81Inventor score
Files withSUSS MICROTEC TEST SYS GMBH4KIESEWETTER JOERG2CASCADE MICROTECH INC1SUSS MICRO TEC TEST SYSTEMS GM1TEICH MICHAEL1
Top patents by PatentIndex Score
9 records- 0184US8497693B2Method for testing a test substrate under defined thermal conditions and thermally conditionable proberKIESEWETTER JOERG·Filed 2008·Granted Jul 30, 2013·12 cites·16 claims
- 0276US7235990B1Probe station comprising a bellows with EMI shielding capabilitiesSUSS MICROTEC TEST SYS GMBH·Filed 2005·Granted Jun 26, 2007·9 cites·18 claims
- 0373US8072586B2Arrangement and method for focusing a multiplane image acquisition on a proberTEICH MICHAEL·Filed 2010·Granted Dec 6, 2011·4 cites·4 claims
- 0457US8402848B2Probe holderKIESEWETTER JOERG·Filed 2008·Granted Mar 26, 2013·3 cites·7 claims
- 0554US9395411B2Method for testing a test substrate under defined thermal conditions and thermally conditionable proberCASCADE MICROTECH INC·Filed 2013·Granted Jul 19, 2016·0 cites·9 claims
- 0647US7282930B2Device for testing thin elementsSUSS MICROTEC TEST SYS GMBH·Filed 2005·Granted Oct 16, 2007·2 cites·24 claims
- 0746US2010011569A1Apparatus and method for assembling several semiconductor devices onto a target substrateSUSS MICROTEC TEST SYS GMBH·Filed 2008·Application pending·0 cites
- 0844US7265536B2Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe stationSUSS MICROTEC TEST SYS GMBH·Filed 2006·Granted Sep 4, 2007·1 cites·18 claims
- 0937US2008212078A1Arrangement and method for focusing a multiplane image acquisition on a proberSUSS MICRO TEC TEST SYSTEMS GM·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →