Inventor · disambiguated record
Jong-Chern Lee
Also filed as: LEE JONG C · LEE JONG CHERN
59 granted patents·14 pending applications·243 citations·filing 2001–2019
98Inventor score
Top patents by PatentIndex Score
73 records- 0193US9851401B2Stacked memory device and semiconductor memory system including the sameSK HYNIX INC·Filed 2016·Granted Dec 26, 2017·14 cites·19 claims
- 0291US8223523B2Semiconductor apparatus and chip selection method thereofJIN SIN HYUN·Filed 2009·Granted Jul 17, 2012·25 cites·11 claims
- 0385US8917569B2Semiconductor apparatus transmitting fuse information and repair method thereofCHOI MIN SEOK·Filed 2011·Granted Dec 23, 2014·10 cites·40 claims
- 0485US7177226B2Word line driving circuit of semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Feb 13, 2007·14 cites·15 claims
- 0584US9647666B1Transmitter and semiconductor deviceSK HYNIX INC·Filed 2016·Granted May 9, 2017·5 cites·7 claims
- 0683US6998901B2Self refresh oscillatorHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Feb 14, 2006·33 cites·12 claims
- 0781US8233339B2Semiconductor memory deviceYOON HYUN-SU·Filed 2010·Granted Jul 31, 2012·8 cites·29 claims
- 0881US7733162B2Plumping voltage generating circuitHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Jun 8, 2010·12 cites·20 claims
- 0980US9928205B2Semiconductor apparatusKIM DAE SUK·Filed 2011·Granted Mar 27, 2018·6 cites·27 claims
- 1078US8243485B2Semiconductor apparatus and chip selection method thereofJIN SIN HYUN·Filed 2009·Granted Aug 14, 2012·8 cites·23 claims
- 1178US8159261B2Semiconductor circuitKIM CHUL·Filed 2010·Granted Apr 17, 2012·5 cites·35 claims
- 1278US8143925B2Delay locked loopAHN SEUNG-JOON·Filed 2010·Granted Mar 27, 2012·6 cites·12 claims
- 1375US7492646B2Internal voltage generator of semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Feb 17, 2009·10 cites·11 claims
- 1475US7339397B2Data output apparatus and methodHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Mar 4, 2008·4 cites·8 claims
- 1574US8487431B2Semiconductor integrated circuit having a multi-chip structureJIN SIN-HYUN·Filed 2010·Granted Jul 16, 2013·4 cites·9 claims
- 1673US7539064B2Precharge circuit of semiconductor memory apparatusHYNIX SEMICONDUCTOR INC·Filed 2006·Granted May 26, 2009·8 cites·33 claims
- 1772US6639854B2Redundancy circuit of semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2001·Granted Oct 28, 2003·21 cites·32 claims
- 1869US8760181B2Semiconductor system and device for identifying stacked chips and method thereofBYEON SANG-JIN·Filed 2010·Granted Jun 24, 2014·4 cites·24 claims
- 1968US9224722B2Semiconductor apparatus capable of detecting whether pad and bump are stackedSK HYNIX INC·Filed 2014·Granted Dec 29, 2015·2 cites·11 claims
- 2066US9829537B2Stack type semiconductor apparatus and system including the stack type semiconductor apparatusSK HYNIX INC·Filed 2016·Granted Nov 28, 2017·1 cites·27 claims
- 2165US8344783B2Delay circuit and method for delaying signalSK HYNIX INC·Filed 2010·Granted Jan 1, 2013·2 cites·15 claims
- 2263US8829933B2Semiconductor apparatus and probe test method thereofYUN TAE SIK·Filed 2010·Granted Sep 9, 2014·1 cites·17 claims
- 2363US8331171B2Semiconductor memory apparatusKIM JAE IL·Filed 2010·Granted Dec 11, 2012·1 cites·16 claims
- 2462US8946869B2Integrated circuit for detecting defects of through chip viaKIM DAE-SUK·Filed 2011·Granted Feb 3, 2015·1 cites·8 claims
- 2562US8923079B1Semiconductor apparatus having a data bit inversion functionSK HYNIX INC·Filed 2013·Granted Dec 30, 2014·2 cites·8 claims
- 2662US8451037B2Duty cycle correction circuitAHN SEUNG-JOON·Filed 2011·Granted May 28, 2013·2 cites·23 claims
- 2761US7157893B2Temperature independent reference voltage generatorHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Jan 2, 2007·16 cites·14 claims
- 2860US7317338B2Data input buffer in semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Jan 8, 2008·3 cites·12 claims
- 2959US7705636B2Buffer circuit which occupies less area in a semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Apr 27, 2010·3 cites·16 claims
- 3057US8477545B2Semiconductor apparatusJIN SIN HYUN·Filed 2010·Granted Jul 2, 2013·2 cites·11 claims
- 3156US7969220B2Delay circuitHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Jun 28, 2011·2 cites·11 claims
- 3255US8599627B2Semiconductor memory apparatusSK HYNIX INC·Filed 2012·Granted Dec 3, 2013·0 cites·10 claims
- 3354US9360520B2Test mode control circuit of semiconductor apparatus and control method thereofYUN TAE SIK·Filed 2011·Granted Jun 7, 2016·1 cites·20 claims
- 3454US8625375B2Temperature detection circuit of semiconductor memory apparatusHYNIX SEMICONDUCTOR INC·Filed 2012·Granted Jan 7, 2014·1 cites·5 claims
- 3554US8482331B2Open loop type delay locked loop and method for operating the sameAHN SEUNG-JOON·Filed 2010·Granted Jul 9, 2013·1 cites·16 claims
- 3653US9355902B2Method of fabricating semiconductor apparatus with through-silicon via and method of fabricating stack package including the semiconductor chipSK HYNIX INC·Filed 2014·Granted May 31, 2016·0 cites·12 claims
- 3753US8411512B2Semiconductor memory apparatusKIM CHUL·Filed 2010·Granted Apr 2, 2013·1 cites·9 claims
- 3852US8436651B2Command control circuit for semiconductor integrated deviceYOON HYUN-SU·Filed 2009·Granted May 7, 2013·2 cites·21 claims
- 3951US8823181B2Stack semiconductor apparatus having a through silicon via and method of fabricating the sameKIM CHUL·Filed 2012·Granted Sep 2, 2014·0 cites·11 claims
- 4051US8581369B2Semiconductor chip and semiconductor waferCHOI JUN-GI·Filed 2012·Granted Nov 12, 2013·0 cites·10 claims
- 4150US9202802B2Semiconductor apparatus having through via capable of testing connectivity of through viaSK HYNIX INC·Filed 2014·Granted Dec 1, 2015·0 cites·14 claims
- 4250US9188626B2Semiconductor apparatus and test method thereofSK HYNIX INC·Filed 2012·Granted Nov 17, 2015·0 cites·15 claims
- 4350US2011102006A1Circuit and method for testing semiconductor apparatusHYNIX SEMICONDUCTOR INC·Filed 2009·Application pending·0 cites
- 4448US10895998B2Controller and operating method thereofSK HYNIX INC·Filed 2019·Granted Jan 19, 2021·0 cites·19 claims
- 4547US7847620B2Charge pumping circuit with decreased current consumptionHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Dec 7, 2010·1 cites·6 claims
- 4647US7622962B2Sense amplifier control signal generating circuit of semiconductor memory apparatusHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Nov 24, 2009·1 cites·11 claims
- 4746US11107546B2Memory device and operating method thereofSK HYNIX INC·Filed 2019·Granted Aug 31, 2021·0 cites·21 claims
- 4846US8314476B2Semiconductor chip and semiconductor waferCHOI JUN-GI·Filed 2010·Granted Nov 20, 2012·0 cites·13 claims
- 4945US2015123133A1Integrated circuit for detecting defects of through chip viaSK HYNIX INC·Filed 2015·Application pending·0 cites
- 5042US9793896B1Semiconductor deviceSK HYNIX INC·Filed 2017·Granted Oct 17, 2017·0 cites·16 claims
Showing the top 50 of 73 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →