Inventor · disambiguated record
John Mitchels
Also filed as: MITCHELS JOHN · MITCHELS JOHN M
4 granted patents·2 pending applications·1 citations·filing 2016–2024
56Inventor score
Files withFEI CO6
Top patents by PatentIndex Score
6 records- 0166US10170275B2Cryogenic specimen processing in a charged particle microscopeFEI CO·Filed 2017·Granted Jan 1, 2019·1 cites·20 claims
- 0252US11802823B2System and method for handling cryo-charged particle samplesFEI CO·Filed 2021·Granted Oct 31, 2023·0 cites·19 claims
- 0350US12020895B2Systems and apparatuses for contamination-free vacuum transfer of samplesFEI CO·Filed 2022·Granted Jun 25, 2024·0 cites·19 claims
- 0448US2024426717A1Method and System for Sample PreparationFEI CO·Filed 2024·Application pending·0 cites
- 0545US2024162001A1Method of sample preparaton and analysisFEI CO·Filed 2023·Application pending·0 cites
- 0637US10475629B2Charged-particle microscope with in situ deposition functionalityFEI CO·Filed 2016·Granted Nov 12, 2019·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →