Inventor · disambiguated record
Johannes Jacobus Lambertus Mulders
Also filed as: MULDERS JOHANNES JACOBUS LAMBE · MULDERS JOHANNES JACOBUS LAMBERTUS
13 granted patents·2 pending applications·65 citations·filing 2004–2018
90Inventor score
Files withFEI CO8MULDERS JOHANNES JACOBUS LAMBERTUS3BOTMAN AURELIEN PHILIPPE JEAN MACLOU1FABER JACOB SIMON1JONG ALAN FRANK DE1
Top patents by PatentIndex Score
15 records- 0191US7258901B1Directed growth of nanotubes on a catalystFEI CO·Filed 2006·Granted Aug 21, 2007·15 cites·5 claims
- 0286US8796646B2Beam-induced deposition at cryogenic temperaturesMULDERS JOHANNES JACOBUS LAMBERTUS·Filed 2011·Granted Aug 5, 2014·5 cites·19 claims
- 0385US8884248B2Forming a vitrified sample for electron microscopyFEI CO·Filed 2013·Granted Nov 11, 2014·6 cites·20 claims
- 0485US7977631B2Method for obtaining images from slices of specimenFEI CO·Filed 2007·Granted Jul 12, 2011·12 cites·22 claims
- 0581US8598542B2Charged particle beam processingTOTH MILOS·Filed 2010·Granted Dec 3, 2013·5 cites·8 claims
- 0678US8168948B2Method of machining a work piece with a focused particle beamBOTMAN AURELIEN PHILIPPE JEAN MACLOU·Filed 2009·Granted May 1, 2012·6 cites·24 claims
- 0775US8431896B2Method for obtaining images from slices of specimenMULDERS JOHANNES JACOBUS LAMBERTUS·Filed 2011·Granted Apr 30, 2013·4 cites·19 claims
- 0864US8597565B2Method for forming microscopic 3D structuresFABER JACOB SIMON·Filed 2010·Granted Dec 3, 2013·2 cites·23 claims
- 0963US9206504B2Low energy ion milling or depositionFEI CO·Filed 2014·Granted Dec 8, 2015·1 cites·14 claims
- 1061US8268532B2Method for forming microscopic structures on a substrateJONG ALAN FRANK DE·Filed 2009·Granted Sep 18, 2012·2 cites·12 claims
- 1154US9617641B2Au-containing layer for charged particle beam processingMULDERS JOHANNES JACOBUS LAMBERTUS·Filed 2010·Granted Apr 11, 2017·0 cites·17 claims
- 1254US7032437B2Directed growth of nanotubes on a catalystFEI CO·Filed 2004·Granted Apr 25, 2006·7 cites·34 claims
- 1341US9406482B2Charged-particle microscope with Raman spectroscopy capabilityFEI CO·Filed 2014·Granted Aug 2, 2016·0 cites·20 claims
- 1441US2019172696A1SIMS Spectrometry TechniqueFEI CO·Filed 2018·Application pending·0 cites
- 1535US2016244871A1Multi-source gis for particle-optical apparatusFEI CO·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →