Inventor · disambiguated record
John Rennie
Also filed as: RENNIE JOHN · RENNIE JOHN L · RENNIE JOHN LIONEL
27 granted patents·1 pending application·2,310 citations·filing 1976–2019
98Inventor score
Top patents by PatentIndex Score
28 records- 0199US7986018B2Solid-state imaging deviceSONY CORP·Filed 2007·Granted Jul 26, 2011·200 cites·17 claims
- 0298US5864171ASemiconductor optoelectric device and method of manufacturing the sameTOSHIBA KK·Filed 1996·Granted Jan 26, 1999·161 cites·18 claims
- 0398US5696389ALight-emitting semiconductor deviceTOSHIBA KK·Filed 1995·Granted Dec 9, 1997·623 cites·21 claims
- 0495US6031858ASemiconductor laser and method of fabricating sameTOSHIBA KK·Filed 1997·Granted Feb 29, 2000·127 cites·11 claims
- 0594US6242761B1Nitride compound semiconductor light emitting deviceTOSHIBA KK·Filed 1998·Granted Jun 5, 2001·243 cites·19 claims
- 0693US8395686B2Solid-state imaging device, method of manufacturing the same, and cameraTATANI KEIJI·Filed 2008·Granted Mar 12, 2013·19 cites·19 claims
- 0793US6400742B1Semiconductor laser and method of fabricating sameTOSHIBA KK·Filed 2000·Granted Jun 4, 2002·41 cites·21 claims
- 0893US5889295ASemiconductor deviceTOSHIBA KK·Filed 1997·Granted Mar 30, 1999·197 cites·21 claims
- 0989US6057564ASemiconductor device having a GaNO region intermediate a GaN-based contact region and an electrodeTOSHIBA KK·Filed 1998·Granted May 2, 2000·78 cites·8 claims
- 1089US4051403AChannel plate multiplier having higher secondary emission coefficient near inputUS ARMY·Filed 1976·Granted Sep 27, 1977·42 cites·4 claims
- 1188US8350937B2Solid-state imaging device having pixels including avalanche photodiodesSONY CORP·Filed 2010·Granted Jan 8, 2013·5 cites·6 claims
- 1288US5932896ANitride system semiconductor device with oxygenTOSHIBA KK·Filed 1997·Granted Aug 3, 1999·111 cites·16 claims
- 1386US6060335ASemiconductor light emitting device and method of manufacturing the sameTOSHIBA KK·Filed 1998·Granted May 9, 2000·102 cites·19 claims
- 1482US7791011B2Solid-state imaging device and manufacturing method thereof and electronic apparatus and manufacturing method thereofSONY CORP·Filed 2009·Granted Sep 7, 2010·5 cites·14 claims
- 1580US6080599ASemiconductor optoelectric device and method of manufacturing the sameTOSHIBA KK·Filed 1998·Granted Jun 27, 2000·37 cites·21 claims
- 1679US6121638AMulti-layer structured nitride-based semiconductor devicesTOSHIBA KK·Filed 1997·Granted Sep 19, 2000·71 cites·3 claims
- 1779US5780873ASemiconductor device capable of easily forming cavity and its manufacturing methodTOSHIBA KK·Filed 1996·Granted Jul 14, 1998·68 cites·14 claims
- 1875US6204084B1Nitride system semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 1999·Granted Mar 20, 2001·50 cites·12 claims
- 1972US5406574ASemiconductor laser deviceTOSHIBA KK·Filed 1993·Granted Apr 11, 1995·28 cites·5 claims
- 2071US5972730ANitride based compound semiconductor light emitting device and method for producing the sameTOSHIBA KK·Filed 1997·Granted Oct 26, 1999·41 cites·12 claims
- 2169US8072138B2Organic semiconductor element with shield layerMASUDA TSUYOSHI·Filed 2005·Granted Dec 6, 2011·4 cites·2 claims
- 2268US5786603AMultilayer structured semiconductor devicesTOSHIBA KK·Filed 1996·Granted Jul 28, 1998·40 cites·6 claims
- 2364US7459860B2Organic electroluminescence element and method for driving the elementJAPAN SCIENCE & TECH AGENCY·Filed 2005·Granted Dec 2, 2008·2 cites·11 claims
- 2458US8969987B2Solid-state imaging deviceRENNIE JOHN·Filed 2011·Granted Mar 3, 2015·0 cites·21 claims
- 2554US7004303B2Method and apparatus for singulating lumberRENNIE EQUIPMENT INC·Filed 2002·Granted Feb 28, 2006·12 cites·3 claims
- 2651US8152429B2Hay bale collection and stacking systemRENNIE JOHN LIONEL·Filed 2008·Granted Apr 10, 2012·3 cites·18 claims
- 2744USRE44215ESemiconductor optoelectric device and method of manufacturing the sameYAMAMOTO MASAHIRO·Filed 2011·Granted May 14, 2013·0 cites·22 claims
- 2836US2019217907A1Continuous Track Pieces and Associated MethodsRENNIE JOHN LIONEL·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →