Inventor · disambiguated record
John G. Rohrbaugh
Also filed as: ROHRBAUGH JOHN · ROHRBAUGH JOHN G
24 granted patents·5 pending applications·605 citations·filing 1992–2005
97Inventor score
Files withAGILENT TECHNOLOGIES INC14HEWLETT PACKARD CO7AVAGO TECHNOLOGIES GENERAL IP2LAMBERT MICHAEL R1REARICK JEFFREY R1
Top patents by PatentIndex Score
29 records- 0193US6556938B1Systems and methods for facilitating automated test equipment functionality within integrated circuitsAGILENT TECHNOLOGIES INC·Filed 2000·Granted Apr 29, 2003·55 cites·30 claims
- 0287US6707313B1Systems and methods for testing integrated circuitsAGILENT TECHNOLOGIES INC·Filed 2003·Granted Mar 16, 2004·34 cites·20 claims
- 0387US6067651ATest pattern generator having improved test sequence compactionHEWLETT PACKARD CO·Filed 1998·Granted May 23, 2000·67 cites·31 claims
- 0486US6762614B2Systems and methods for facilitating driver strength testing of integrated circuitsAGILENT TECHNOLOGIES INC·Filed 2002·Granted Jul 13, 2004·31 cites·9 claims
- 0585US6865706B1Apparatus and method for generating a set of test vectors using nonrandom fillingAGILENT TECHNOLOGIES INC·Filed 2000·Granted Mar 8, 2005·32 cites·22 claims
- 0685US5905986AHighly compressible representation of test pattern dataHEWLETT PACKARD CO·Filed 1997·Granted May 18, 1999·60 cites·12 claims
- 0783US5390131AApparatus and method for displaying wafer test results in real timeHEWLETT PACKARD CO·Filed 1992·Granted Feb 14, 1995·51 cites·17 claims
- 0881US7043674B2Systems and methods for facilitating testing of pads of integrated circuitsREARICK JEFFREY R·Filed 2003·Granted May 9, 2006·27 cites·21 claims
- 0979US6658613B2Systems and methods for facilitating testing of pad receivers of integrated circuitsAGILENT TECHNOLOGIES INC·Filed 2001·Granted Dec 2, 2003·23 cites·17 claims
- 1078US7516379B2Circuit and method for comparing circuit performance between functional and AC scan testing in an integrated circuit (IC)AVAGO TECHNOLOGIES GENERAL IP·Filed 2004·Granted Apr 7, 2009·21 cites·16 claims
- 1178US7139955B2Hierarchically-controlled automatic test pattern generationAVAGO TECHNOLOGIES GENERAL IP·Filed 2002·Granted Nov 21, 2006·25 cites·27 claims
- 1278US6721920B2Systems and methods for facilitating testing of pad drivers of integrated circuitsAGILENT TECHNOLOGIES INC·Filed 2001·Granted Apr 13, 2004·28 cites·10 claims
- 1377US6396312B1Gate transition counterAGILENT TECHNOLOGIES INC·Filed 2000·Granted May 28, 2002·21 cites·33 claims
- 1474US6859059B2Systems and methods for testing receiver terminations in integrated circuitsAGILENT TECHNOLOGIES INC·Filed 2003·Granted Feb 22, 2005·17 cites·20 claims
- 1569US6577980B1Systems and methods for facilitating testing of pad receivers of integrated circuitsAGILENT TECHNOLOGIES INC·Filed 2000·Granted Jun 10, 2003·12 cites·28 claims
- 1662US5400263AApparatus and method for specifying the flow of test execution and the binning for a testing systemHEWLETT PACKARD CO·Filed 1992·Granted Mar 21, 1995·39 cites·52 claims
- 1761US6986085B2Systems and methods for facilitating testing of pad drivers of integrated circuitsAGILENT TECHNOLOGIES INC·Filed 2002·Granted Jan 10, 2006·8 cites·20 claims
- 1852US6944837B2System and method for evaluating an integrated circuit designAGILENT TECHNOLOGIES INC·Filed 2002·Granted Sep 13, 2005·3 cites·28 claims
- 1949US6895562B2Partitioning integrated circuit hierarchyAGILENT TECHNOLOGIES INC·Filed 2002·Granted May 17, 2005·2 cites·43 claims
- 2048US6907376B2Systems and methods for facilitating testing of pad receivers of integrated circuitsAGILENT TECHNOLOGIES INC·Filed 2003·Granted Jun 14, 2005·3 cites·12 claims
- 2148US5495578AApparatus and method for changing the behavior of a computer program while retaining control of program executionHEWLETT PACKARD CO·Filed 1995·Granted Feb 27, 1996·22 cites·15 claims
- 2245US6741946B2Systems and methods for facilitating automated test equipment functionality within integrated circuitsAGILENT TECHNOLOGIES INC·Filed 2003·Granted May 25, 2004·2 cites·30 claims
- 2339US5381344AApparatus and method for obtaining a list of numbers of wafers for integrated circuit testingHEWLETT PACKARD CO·Filed 1992·Granted Jan 10, 1995·12 cites·24 claims
- 2437US6234689B1Apparatus and method for mapping a custom routine to an interface buttonHEWLETT PACKARD CO·Filed 1995·Granted May 22, 2001·10 cites·10 claims
- 2537US2006156139A1Systems and methods for facilitating testing of integrated circuitsROHRBAUGH JOHN·Filed 2005·Application pending·0 cites
- 2636US2005210349A1Scan test tools, models and/or methodsLAMBERT MICHAEL R·Filed 2004·Application pending·0 cites
- 2735US2004123194A1Systems and methods for testing tri-state bus driversFiled 2002·Application pending·0 cites
- 2835US2004123195A1Systems and methods for testing tri-state bus driversFiled 2002·Application pending·0 cites
- 2935US2004187060A1Generating test patterns for testing an integrated circuitFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →