Inventor · disambiguated record
John L. Sturtevant
Also filed as: STURTEVANT JOHN L
10 granted patents·2 pending applications·224 citations·filing 1994–2021
88Inventor score
Top patents by PatentIndex Score
12 records- 0195US5516608AMethod for controlling a line dimension arising in photolithographic processesIBM·Filed 1994·Granted May 14, 1996·143 cites·2 claims
- 0294US11061373B1Method and system for calculating probability of success or failure for a lithographic process due to stochastic variations of the lithographic processMENTOR GRAPHICS CORP·Filed 2019·Granted Jul 13, 2021·12 cites·17 claims
- 0381US6733936B1Method for generating a swing curve and photoresist feature formed using swing curveINTEGRATED DEVICE TECH·Filed 2002·Granted May 11, 2004·18 cites·23 claims
- 0476US7349752B1Dynamically coupled metrology and lithographyINTEGRATED DEVICE TECH·Filed 2004·Granted Mar 25, 2008·19 cites·32 claims
- 0572US6797456B1Dual-layer deep ultraviolet photoresist process and structureINTEGRATED DEVICE TECH·Filed 2002·Granted Sep 28, 2004·17 cites·11 claims
- 0664US6913872B1Dual-wavelength exposure for reduction of implant shadowingINTEGRATED DEVICE TECH·Filed 2002·Granted Jul 5, 2005·14 cites·14 claims
- 0754US8607168B2Contour alignment for model calibrationKUSNADI IR·Filed 2011·Granted Dec 10, 2013·1 cites·25 claims
- 0852US11270054B1Method and system for calculating printed area metric indicative of stochastic variations of the lithographic processSIEMENS IND SOFTWARE INC·Filed 2020·Granted Mar 8, 2022·0 cites·21 claims
- 0951US11699017B2Die yield assessment based on pattern-failure rate simulationSIEMENS IND SOFTWARE INC·Filed 2019·Granted Jul 11, 2023·0 cites·17 claims
- 1050US2024219847A1Real-time patterning hotspot analyzerSIEMENS IND SOFTWARE INC·Filed 2021·Application pending·0 cites
- 1145US10445452B2Simulation-assisted wafer rework determinationMENTOR GRAPHICS CORP·Filed 2017·Granted Oct 15, 2019·0 cites·17 claims
- 1225US2011202893A1Contour Self-Alignment For Optical Proximity Correction Model CalibrationKUSNADI IR·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →