Inventor · disambiguated record
John Tingay
Also filed as: TINGAY JOHN · TINGAY JOHN MELBOURNE
6 granted patents·1 pending application·14 citations·filing 2003–2015
77Inventor score
Top patents by PatentIndex Score
7 records- 0180US10215716B2X-ray inspection apparatus for inspecting semiconductor wafersNORDSON CORP·Filed 2015·Granted Feb 26, 2019·3 cites·19 claims
- 0275US9129427B2Method and apparatus for generating a three-dimensional model of a region of interest using an imaging systemNORDSON CORP·Filed 2012·Granted Sep 8, 2015·6 cites·14 claims
- 0361US10393675B2X-ray inspection apparatusNORDSON CORP·Filed 2015·Granted Aug 27, 2019·1 cites·24 claims
- 0446US7783377B2Substrate loading and unloading apparatusLEICA MICROSYS LITHOGRAPHY LTD·Filed 2003·Granted Aug 24, 2010·2 cites·53 claims
- 0542US9442080B2Method and apparatus for generating a three-dimensional model of a region of interest using an imaging systemNORDSON CORP·Filed 2015·Granted Sep 13, 2016·0 cites·7 claims
- 0637US6885009B2Device for influencing an electron beamLEICA MICROSYS LITHOGRAPHY LTD·Filed 2003·Granted Apr 26, 2005·2 cites·11 claims
- 0736US2010096567A1Reduction in stage movement reaction force in an electron beam lithography machineVISTEC LITHOGRAPHY INC·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →