Inventor · disambiguated record
Joerg Vollrath
Also filed as: VOLLRATH JOERG
32 granted patents·2 pending applications·246 citations·filing 1997–2012
96Inventor score
Files withINFINEON TECHNOLOGIES AG19INFINEON TECHNOLOGIES RICHMOND6QIMONDA AG3INFINEON TECHNOLOGIES CORP2SOITEC SILICON ON INSULATOR1
Top patents by PatentIndex Score
34 records- 0176US6304479B1Shielded bit line architecture for memory arraysINFINEON TECHNOLOGIES CORP·Filed 2000·Granted Oct 16, 2001·31 cites·19 claims
- 0273US6564346B1Advanced bit fail map compression with fail signature analysisINFINEON TECHNOLOGIES RICHMOND·Filed 1999·Granted May 13, 2003·43 cites·33 claims
- 0373US6453433B1Reduced signal test for dynamic random access memoryINFINEON TECHNOLOGIES AG·Filed 1999·Granted Sep 17, 2002·34 cites·21 claims
- 0472US7376026B2Integrated semiconductor memory having sense amplifiers selectively activated at different timingINFINEON TECHNOLOGIES AG·Filed 2006·Granted May 20, 2008·9 cites·12 claims
- 0569US7719868B2Integrated semiconductor memoryQIMONDA AG·Filed 2007·Granted May 18, 2010·7 cites·39 claims
- 0668US6365947B1Semiconductor device and method of increasing channel length to eliminate short channel effects of corner devicesWHITE OAK SEMICONDUCTOR PARTNE·Filed 2000·Granted Apr 2, 2002·17 cites·11 claims
- 0764US6696349B2STI leakage reductionINFINEON TECHNOLOGIES RICHMOND·Filed 2001·Granted Feb 24, 2004·13 cites·13 claims
- 0862US7196537B2Integrated circuitINFINEON TECHNOLOGIES AG·Filed 2005·Granted Mar 27, 2007·5 cites·15 claims
- 0960US7372095B2Integrated semiconductor circuit comprising a transistor and a strip conductorINFINEON TECHNOLOGIES AG·Filed 2005·Granted May 13, 2008·2 cites·17 claims
- 1056US7068546B2Integrated memory having a voltage generator circuit for generating a voltage supply for a read/write amplifierINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jun 27, 2006·9 cites·4 claims
- 1154US7224627B2Integrated semiconductor circuit and method for testing the sameINFINEON TECHNOLOGIES AG·Filed 2005·Granted May 29, 2007·3 cites·9 claims
- 1254US7051253B2Pseudo fail bit map generation for RAMS during component test and burn-in in a manufacturing environmentINFINEON TECHNOLOGIES RICHMOND·Filed 2001·Granted May 23, 2006·8 cites·17 claims
- 1353US7365554B2Integrated circuit for determining a voltageINFINEON TECHNOLOGIES AG·Filed 2005·Granted Apr 29, 2008·3 cites·14 claims
- 1453US6927557B2Voltage generator arrangementINFINEON TECHNOLOGIES AG·Filed 2003·Granted Aug 9, 2005·8 cites·11 claims
- 1552US7626870B2Semiconductor device with a plurality of one time programmable elementsQIMONDA AG·Filed 2007·Granted Dec 1, 2009·2 cites·19 claims
- 1652US6981175B2Memory and method for employing a checksum for addresses of replaced storage elementsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Dec 27, 2005·3 cites·40 claims
- 1751US6207513B1Spacer process to eliminate corner transistor deviceINFINEON TECHNOLOGIES CORP·Filed 1999·Granted Mar 27, 2001·13 cites·16 claims
- 1850US6967370B2Integrated semiconductor circuit having a multiplicity of memory cellsINFINEON TECHNOLOGIES AG·Filed 2004·Granted Nov 22, 2005·5 cites·7 claims
- 1949US7023276B2Differential amplifier circuitINFINEON TECHNOLOGIES AG·Filed 2004·Granted Apr 4, 2006·6 cites·9 claims
- 2047US6490209B1Memory employing multiple enable/disable modes for redundant elements and testing method using sameINFINEON TECHNOLOGIES RICHMOND·Filed 2001·Granted Dec 3, 2002·4 cites·12 claims
- 2146US6998664B2Integrated semiconductor circuit having a cell array having a multiplicity of memory cellsINFINEON TECHNOLOGIES AG·Filed 2004·Granted Feb 14, 2006·3 cites·10 claims
- 2246US6737671B2Current measurement circuit and method for voltage regulated semiconductor integrated circuit devicesINFINEON TECHNOLOGIES RICHMOND·Filed 2002·Granted May 18, 2004·3 cites·11 claims
- 2345US7313741B2Integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2005·Granted Dec 25, 2007·2 cites·14 claims
- 2444US2008079455A1IC Chip Package, Test Equipment and Interface for Performing a Functional Test of a Chip Contained Within Said Chip PackageVOLLRATH JOERG·Filed 2007·Application pending·0 cites
- 2543US6900626B2Voltage generator arrangementINFINEON TECHNOLOGIES AG·Filed 2003·Granted May 31, 2005·4 cites·10 claims
- 2642US6956404B2Driver circuit having a plurality of drivers for driving signals in parallelINFINEON TECHNOLOGIES AG·Filed 2004·Granted Oct 18, 2005·3 cites·12 claims
- 2738US7402859B2Field effect semiconductor switch and method for fabricating itINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jul 22, 2008·0 cites·23 claims
- 2838US6538939B1Memory employing multiple enable/disable modes for redundant elements and testing method using sameINFINEON TECHNOLOGIES RICHMOND·Filed 2002·Granted Mar 25, 2003·1 cites·8 claims
- 2936US9251871B2Sense amplifier with dual gate precharge and decode transistorsSOITEC SILICON ON INSULATOR·Filed 2012·Granted Feb 2, 2016·0 cites·14 claims
- 3036US5831917ATechniques for reducing redundant element fuses in a dynamic random access memory arrayFiled 1997·Granted Nov 3, 1998·5 cites·24 claims
- 3136US2008180983A1Semiconductor device with a plurality of different one time programmable elementsQIMONDA AG·Filed 2008·Application pending·0 cites
- 3233US7203883B2Integrated circuitINFINEON TECHNOLOGIES AG·Filed 2005·Granted Apr 10, 2007·0 cites·32 claims
- 3333US6853214B2Circuit configuration for controlling load-dependent driver strengthsINFINEON TECHNOLOGIES AG·Filed 2003·Granted Feb 8, 2005·0 cites·9 claims
- 3432US6816094B2Circuit configuration for the bit-parallel outputting of a data wordINFINEON TECHNOLOGIES AG·Filed 2003·Granted Nov 9, 2004·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →