Inventor · disambiguated record
Jonathan K. Winslow, Ii
Also filed as: WINSLOW II JONATHAN K · WINSLOW JONATHAN K
3 granted patents·2 pending applications·0 citations·filing 2007–2015
43Inventor score
Top patents by PatentIndex Score
5 records- 0153US9059190B2Measuring current and resistance using combined diodes/resistor structure to monitor integrated circuit manufacturing process variationsIBM·Filed 2014·Granted Jun 16, 2015·0 cites·18 claims
- 0240US8709833B2Measuring current and resistance using combined diodes/resistor structure to monitor integrated circuit manufacturing process variationsLOGAN LYNDON R·Filed 2011·Granted Apr 29, 2014·0 cites·18 claims
- 0338US2008319568A1Method and system for creating array defect paretos using electrical overlay of bitfail maps, photo limited yield, yield, and auto pattern recognition code dataIBM·Filed 2007·Application pending·0 cites
- 0436US2010174957A1Correlation and overlay of large design physical partitions and embedded macros to detect in-line defectsIBM·Filed 2009·Application pending·0 cites
- 0532US9852956B2Extraction of resistance associated with laterally diffused dopant profiles in CMOS devicesGLOBALFOUNDRIES INC·Filed 2015·Granted Dec 26, 2017·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →