Inventor · disambiguated record
Joerg-Thomas Zettler
Also filed as: ZETTLER JOERG-THOMAS
4 granted patents·3 pending applications·13 citations·filing 2010–2023
69Inventor score
Top patents by PatentIndex Score
7 records- 0174US8514408B2Method and apparatus for real-time determination of curvature and azimuthal asymmetry of a surfaceZETTLER JOERG-THOMAS·Filed 2010·Granted Aug 20, 2013·6 cites·13 claims
- 0265US8496375B2Pyrometer adapted for detecting UV-radiation and use thereofZETTLER JOERG-THOMAS·Filed 2010·Granted Jul 30, 2013·3 cites·18 claims
- 0358US8388219B2Method for calibrating a pyrometer, method for determining the temperature of a semiconducting wafer and system for determining the temperature of a semiconducting waferZETTLER JOERG-THOMAS·Filed 2010·Granted Mar 5, 2013·3 cites·15 claims
- 0455US8233158B2Method and apparatus for determining the layer thickness and the refractive index of a sampleZETTLER JOERG-THOMAS·Filed 2010·Granted Jul 31, 2012·1 cites·15 claims
- 0542US2024027184A1Method and Apparatus for Measuring the Thickness of a Transparent Layer on Nanometer ScaleLAYTEC AG·Filed 2023·Application pending·0 cites
- 0635US2021381899A1Method and device for the in-situ determination of the temperature of a sampleLAYTEC AG·Filed 2021·Application pending·0 cites
- 0727US2013294476A1Flat light emitting plate for simulating thermal radiation, method for calibrating a pyrometer and method for determining the temperature of a semiconducting waferLAYTEC AG·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →