Inventor · disambiguated record
Junwei Bao
Also filed as: BAO JUNWEI
129 granted patents·33 pending applications·1,309 citations·filing 2001–2024
99Inventor score
Top patents by PatentIndex Score
162 records- 0198US11009605B2MEMS beam steering and fisheye receiving lens for LiDAR systemINNOVUSION IRELAND LTD·Filed 2017·Granted May 18, 2021·65 cites·16 claims
- 0298US10969475B2Method and system for encoding and decoding LiDARINNOVUSION IRELAND LTD·Filed 2018·Granted Apr 6, 2021·81 cites·17 claims
- 0398US6721691B2Metrology hardware specification using a hardware simulatorTIMBRE TECH INC·Filed 2002·Granted Apr 13, 2004·162 cites·27 claims
- 0497US6609086B1Profile refinement for integrated circuit metrologyTIMBRE TECH INC·Filed 2002·Granted Aug 19, 2003·113 cites·76 claims
- 0596US10942257B22D scanning high precision LiDAR using combination of rotating concave mirror and beam steering devicesINNOVUSION IRELAND LTD·Filed 2017·Granted Mar 9, 2021·13 cites·35 claims
- 0695US7372583B1Controlling a fabrication tool using support vector machineTOKYO ELECTRON LTD·Filed 2007·Granted May 13, 2008·22 cites·23 claims
- 0795US7330279B2Model and parameter selection for optical metrologyTIMBRE TECH INC·Filed 2002·Granted Feb 12, 2008·58 cites·52 claims
- 0894US11782132B22D scanning high precision LiDAR using combination of rotating concave mirror and beam steering devicesINNOVUSION INC·Filed 2023·Granted Oct 10, 2023·1 cites·15 claims
- 0994US11300683B2Multiwavelength LiDAR designINNOVUSION IRELAND LTD·Filed 2018·Granted Apr 12, 2022·15 cites·14 claims
- 1094US11054508B2High resolution LiDAR using high frequency pulse firingINNOVUSION IRELAND LTD·Filed 2017·Granted Jul 6, 2021·16 cites·15 claims
- 1194US7831528B2Optical metrology of structures formed on semiconductor wafers using machine learning systemsTOKYO ELECTRON LTD·Filed 2009·Granted Nov 9, 2010·29 cites·29 claims
- 1294US7280229B2Examining a structure formed on a semiconductor wafer using machine learning systemsTIMBRE TECH INC·Filed 2004·Granted Oct 9, 2007·51 cites·24 claims
- 1394US7064829B2Generic interface for an optical metrology systemTIMBRE TECH INC·Filed 2003·Granted Jun 20, 2006·47 cites·29 claims
- 1493US7388677B2Optical metrology optimization for repetitive structuresTIMBRE TECH INC·Filed 2005·Granted Jun 17, 2008·26 cites·29 claims
- 1593US6775015B2Optical metrology of single featuresTIMBRE TECH INC·Filed 2002·Granted Aug 10, 2004·42 cites·55 claims
- 1692US12204033B2Multimodal detection with integrated sensorsINNOVUSION INC·Filed 2023·Granted Jan 21, 2025·3 cites·29 claims
- 1792US7126700B2Parametric optimization of optical metrology modelTIMBRE TECH INC·Filed 2003·Granted Oct 24, 2006·59 cites·56 claims
- 1891US7588949B2Optical metrology model optimization based on goalsTOKYO ELECTRON LTD·Filed 2007·Granted Sep 15, 2009·11 cites·23 claims
- 1991US7171284B2Optical metrology model optimization based on goalsTIMBRE TECH INC·Filed 2004·Granted Jan 30, 2007·49 cites·55 claims
- 2090US7567352B2Controlling a fabrication tool using support vector machineTOKYO ELECTRON LTD·Filed 2008·Granted Jul 28, 2009·10 cites·23 claims
- 2189US7467064B2Transforming metrology data from a semiconductor treatment system using multivariate analysisTIMBRE TECH INC·Filed 2006·Granted Dec 16, 2008·16 cites·22 claims
- 2288US11953601B2Multiwavelength lidar designINNOVUSION IRELAND LTD·Filed 2021·Granted Apr 9, 2024·1 cites·23 claims
- 2388US11289873B2LiDAR systems and methods for exercising precise control of a fiber laserINNOVUSION IRELAND LTD·Filed 2019·Granted Mar 29, 2022·3 cites·22 claims
- 2488US7271902B2Generic interface for an optical metrology systemTIMBRE TECH INC·Filed 2006·Granted Sep 18, 2007·9 cites·20 claims
- 2587US12241999B22D scanning high precision LiDAR using combination of rotating concave mirror and beam steering devicesINNOVUSION IRELAND LTD·Filed 2021·Granted Mar 4, 2025·1 cites·35 claims
- 2687US7617075B2Library accuracy enhancment and evaluationTOKYO ELECTRON LTD·Filed 2007·Granted Nov 10, 2009·7 cites·20 claims
- 2787US7417750B2Consecutive measurement of structures formed on a semiconductor wafer using an angle-resolved spectroscopic scatterometerTOKYO ELECTRON LTD·Filed 2006·Granted Aug 26, 2008·11 cites·26 claims
- 2887US7355728B2Optical metrology model optimization for repetitive structuresTIMBRE TECH INC·Filed 2005·Granted Apr 8, 2008·20 cites·33 claims
- 2987US2025102629A1High density lidar systemsSEYOND INC·Filed 2024·Application pending·0 cites
- 3086US11768294B2Compact lidar systems for vehicle contour fittingINNOVUSION INC·Filed 2022·Granted Sep 26, 2023·1 cites·30 claims
- 3186US7302367B2Library accuracy enhancement and evaluationTIMBRE TECH INC·Filed 2006·Granted Nov 27, 2007·14 cites·22 claims
- 3285US7526354B2Managing and using metrology data for process and equipment controlTOKYO ELECTRON LTD·Filed 2006·Granted Apr 28, 2009·10 cites·31 claims
- 3384US9970818B2Spatially resolved optical emission spectroscopy (OES) in plasma processingTOKYO ELECTRON LTD·Filed 2014·Granted May 15, 2018·5 cites·19 claims
- 3484US7379192B2Optical metrology of single featuresTIMBRE TECH INC·Filed 2006·Granted May 27, 2008·6 cites·19 claims
- 3584US7136796B2Generation and use of integrated circuit profile-based simulation informationTIMBRE TECH INC·Filed 2002·Granted Nov 14, 2006·32 cites·51 claims
- 3683US12276755B22D scanning high precision LiDAR using combination of rotating concave mirror and beam steering devicesINNOVUSION INC·Filed 2023·Granted Apr 15, 2025·0 cites·23 claims
- 3783US11977183B22D scanning high precision LiDAR using combination of rotating concave mirror and beam steering devicesINNOVUSION INC·Filed 2023·Granted May 7, 2024·0 cites·30 claims
- 3883US11899134B22D scanning high precision lidar using combination of rotating concave mirror and beam steering devicesINNOVUSION INC·Filed 2023·Granted Feb 13, 2024·0 cites·26 claims
- 3983US11782131B22D scanning high precision LiDAR using combination of rotating concave mirror and beam steering devicesINNOVUSION INC·Filed 2023·Granted Oct 10, 2023·0 cites·20 claims
- 4083US8346506B2Transforming metrology data from a semiconductor treatment system using multivariate analysisTOKYO ELECTRON LTD·Filed 2012·Granted Jan 1, 2013·4 cites·4 claims
- 4183US7667858B2Automated process control using optical metrology and a correlation between profile models and key profile shape variablesTOKYO ELECTRON LTD·Filed 2007·Granted Feb 23, 2010·9 cites·26 claims
- 4282US7505153B2Model and parameter selection for optical metrologyTIMBRE TECH INC·Filed 2008·Granted Mar 17, 2009·5 cites·19 claims
- 4382US7450232B2Generic interface for an optical metrology systemTIMBRE TECH INC·Filed 2007·Granted Nov 11, 2008·9 cites·20 claims
- 4482US6853942B2Metrology hardware adaptation with universal libraryTIMBRE TECH INC·Filed 2002·Granted Feb 8, 2005·20 cites·62 claims
- 4581US12248095B22D scanning high precision LiDAR using combination of rotating concave mirror and beam steering devicesINNOVUSION INC·Filed 2022·Granted Mar 11, 2025·0 cites·28 claims
- 4681US7580823B2Generation and use of integrated circuit profile-based simulation informationTOKYO ELECTRON LTD·Filed 2006·Granted Aug 25, 2009·9 cites·20 claims
- 4781US6597463B1System to determine suitability of sion arc surface for DUV resist patterningADVANCED MICRO DEVICES INC·Filed 2001·Granted Jul 22, 2003·31 cites·26 claims
- 4881US2024402307A1Compact lidar design with high resolution and ultra-wide field of viewSEYOND INC·Filed 2024·Application pending·0 cites
- 4980US12189058B2High resolution LiDAR using high frequency pulse firingINNOVUSION INC·Filed 2022·Granted Jan 7, 2025·0 cites·19 claims
- 5080US11860316B1Systems and method for debris and water obfuscation compensation for use in LiDAR systemsINNOVUSION IRELAND LTD·Filed 2019·Granted Jan 2, 2024·3 cites·20 claims
Showing the top 50 of 162 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Junwei Bao files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →