Inventor · disambiguated record
Jung-Chin Chen
Also filed as: CHEN JUNG-CHIN
6 granted patents·1 pending application·29 citations·filing 1999–2022
77Inventor score
Top patents by PatentIndex Score
7 records- 0187US7550336B2Method for fabricating an NMOS transistorUNITED MICROELECTRONICS CORP·Filed 2006·Granted Jun 23, 2009·14 cites·18 claims
- 0282US11604153B2Method of preparing a sample for physical analysisMSSCORPS CO LTD·Filed 2020·Granted Mar 14, 2023·2 cites·9 claims
- 0354US2024093364A1Defect-reducing coating methodMSSCORPS CO LTD·Filed 2022·Application pending·0 cites
- 0453US11468556B2Artificial intelligence identified measuring method for a semiconductor imageMSSCORPS CO LTD·Filed 2021·Granted Oct 11, 2022·0 cites·15 claims
- 0548US6905890B2Poly gate silicide inspection by back end etching and by enhanced gas etchingTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Jun 14, 2005·2 cites·5 claims
- 0646US6482748B1Poly gate silicide inspection by back end etchingTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Nov 19, 2002·11 cites·10 claims
- 0743US11828800B2Method of preparing a semiconductor specimen for failure analysisMSSCORPS CO LTD·Filed 2021·Granted Nov 28, 2023·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →