Inventor · disambiguated record
Junichi Kakuta
Also filed as: KAKUTA JUNICHI
11 granted patents·11 pending applications·13 citations·filing 2008–2023
83Inventor score
Top patents by PatentIndex Score
22 records- 0178US8481934B2Method for inspecting and measuring sample and scanning electron microscopeEZUMI MAKOTO·Filed 2011·Granted Jul 9, 2013·3 cites·8 claims
- 0277US7960696B2Method for inspecting and measuring sample and scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2008·Granted Jun 14, 2011·4 cites·4 claims
- 0368US8188427B2Scanning electron microscope alignment method and scanning electron microscopeKAKUTA JUNICHI·Filed 2008·Granted May 29, 2012·3 cites·10 claims
- 0467US11899317B2Laminated glass, and method for manufacturing laminated glassAGC INC·Filed 2023·Granted Feb 13, 2024·0 cites·22 claims
- 0567US2020299424A1Curable composition, adhesive layer, transparent surface material, laminate and image display deviceAGC INC·Filed 2020·Application pending·0 cites
- 0666US8052146B2Sheet transport apparatusDUPLO SEIKO CORP·Filed 2008·Granted Nov 8, 2011·3 cites·7 claims
- 0765US12429722B2Laminated glassAGC INC·Filed 2023·Granted Sep 30, 2025·0 cites·20 claims
- 0865US2018282445A1Curable composition, adhesive layer, transparent surface material, laminate and image display deviceASAHI GLASS CO LTD·Filed 2018·Application pending·0 cites
- 0958US2014001359A1Method for inspecting and measuring sample and scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 1054US2023314128A1Processing System and Charged Particle Beam ApparatusHITACHI HIGH TECH CORP·Filed 2023·Application pending·0 cites
- 1151US2018229477A1Glass-resin composite and method for producing sameASAHI GLASS CO LTD·Filed 2018·Application pending·0 cites
- 1249US10082603B2Optical component production method, optical component, and optical panel production methodASAHI GLASS CO LTD·Filed 2014·Granted Sep 25, 2018·0 cites·18 claims
- 1347US10665424B2Pattern measuring method and pattern measuring apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted May 26, 2020·0 cites·8 claims
- 1447US2011147587A1Diagnosis device of recipe used for scanning electron microscopeYANG KYOUNGMO·Filed 2009·Application pending·0 cites
- 1546US12505976B2Charged particle beam apparatus and method for calculating roughness indexHITACHI HIGH TECH CORP·Filed 2020·Granted Dec 23, 2025·0 cites·14 claims
- 1646US12347074B2Pattern measurement system, pattern measurement method, and program for measuring edge roughness at the edge of a pattern based on a random noise componentHITACHI HIGH TECH CORP·Filed 2021·Granted Jul 1, 2025·0 cites·12 claims
- 1742US2016082699A1Resin layer-attached supporting substrate and method for producing same, glass laminate and method for producing same, and method for producing electronic deviceASAHI GLASS CO LTD·Filed 2015·Application pending·0 cites
- 1842US2016075110A1Flexible substrate and method for producing same, glass laminate and method for producing same, and method for producing electronic deviceASAHI GLASS CO LTD·Filed 2015·Application pending·0 cites
- 1941US2017101340A1Adhesive layer-equipped transparent plate and adhesive layerASAHI GLASS CO LTD·Filed 2016·Application pending·0 cites
- 2040US2018074397A1Chemically strengthened glassASAHI GLASS CO LTD·Filed 2017·Application pending·0 cites
- 2138US2013237040A1Resin composition, laminate and process for production thereof, structure and process for production thereof, and process for production of electronic deviceASAHI GLASS CO LTD·Filed 2013·Application pending·0 cites
- 2232US8929665B2Method of manufacturing a template matching template, as well as a device for manufacturing a templateYAMADA YUKARI·Filed 2010·Granted Jan 6, 2015·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →