Inventor · disambiguated record
Junichi Katane
Also filed as: KATANE JUNICHI
22 granted patents·5 pending applications·66 citations·filing 2004–2021
92Inventor score
Files withHITACHI HIGH TECH CORP21HITACHI SCIENCE SYSTEMS LTD2HATANO MICHIO1ITO SUKEHIRO1KATANE JUNICHI1
Top patents by PatentIndex Score
27 records- 0190US7755045B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2007·Granted Jul 13, 2010·14 cites·15 claims
- 0290US7511271B2Scanning electron microscopeHITACHI SCIENCE SYSTEMS LTD·Filed 2005·Granted Mar 31, 2009·12 cites·16 claims
- 0386US8294097B2Charged particle radiation deviceKATANE JUNICHI·Filed 2010·Granted Oct 23, 2012·11 cites·14 claims
- 0482US8026491B2Charged particle beam apparatus and method for charged particle beam adjustmentHITACHI HIGH TECH CORP·Filed 2007·Granted Sep 27, 2011·9 cites·5 claims
- 0580US11170972B2Scanning electron microscope and method for analyzing secondary electron spin polarizationHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 9, 2021·2 cites·15 claims
- 0674US8692195B2Charged particle radiation deviceHITACHI HIGH TECH CORP·Filed 2012·Granted Apr 8, 2014·2 cites·16 claims
- 0770US10886101B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Jan 5, 2021·1 cites·10 claims
- 0865US7154089B2Scanning electron microscopeHITACHI SCIENCE SYSTEMS LTD·Filed 2004·Granted Dec 26, 2006·6 cites·7 claims
- 0963US8143573B2Charged particle beam apparatusITO SUKEHIRO·Filed 2009·Granted Mar 27, 2012·1 cites·20 claims
- 1061US11756763B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 12, 2023·0 cites·13 claims
- 1159US12400827B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Aug 26, 2025·0 cites·18 claims
- 1258US12431325B2Sample image observation device and method for sameHITACHI HIGH TECH CORP·Filed 2020·Granted Sep 30, 2025·0 cites·10 claims
- 1358US2010090109A1Scanning electron microscopeHATANO MICHIO·Filed 2009·Application pending·0 cites
- 1453US9824854B2Charged particle beam device, image generation method, observation systemHITACHI HIGH TECH CORP·Filed 2014·Granted Nov 21, 2017·0 cites·18 claims
- 1553US7557346B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2007·Granted Jul 7, 2009·0 cites·6 claims
- 1651US11823861B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Nov 21, 2023·0 cites·7 claims
- 1751US2025006454A1Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1850US12437958B2Electron beam application deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Oct 7, 2025·0 cites·15 claims
- 1950US12217928B2Electron gun and electron microscopeHITACHI HIGH TECH CORP·Filed 2020·Granted Feb 4, 2025·0 cites·14 claims
- 2050US11961699B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Apr 16, 2024·0 cites·15 claims
- 2150USD687475SElectron microscopeOONUMA MITSURU·Filed 2012·Granted Aug 6, 2013·8 cites·1 claims
- 2250US2024128049A1Electron microscopeHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 2350US2024222065A1Sample image observation device and methodHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 2449US12165828B2Electron gun and electron beam application apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Dec 10, 2024·0 cites·11 claims
- 2548US2024161997A1Electron beam application deviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 2639US11430630B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2017·Granted Aug 30, 2022·0 cites·13 claims
- 2738US11640897B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted May 2, 2023·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →