Inventor · disambiguated record
Junha Lee
Also filed as: LEE JUNHA
9 granted patents·3 pending applications·16 citations·filing 2020–2024
81Inventor score
Top patents by PatentIndex Score
12 records- 0194US11127462B2Multi-chip package with reduced calibration time and ZQ calibration method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Sep 21, 2021·4 cites·11 claims
- 0292US11217283B2Multi-chip package with reduced calibration time and ZQ calibration method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jan 4, 2022·3 cites·11 claims
- 0391US11145355B2Calibration circuit for controlling resistance of output driver circuit, memory device including the same, and operating method of the memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Oct 12, 2021·6 cites·19 claims
- 0483US11475955B2Multi-chip package with reduced calibration time and ZQ calibration method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Oct 18, 2022·1 cites·14 claims
- 0583US10998888B2Parameter monitoring circuit for detecting error of parameter, duty cycle correction circuit, and impedance calibration circuitSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted May 4, 2021·2 cites·16 claims
- 0671US2024379141A1Memory device that includes a duty correction circuit, memory controller that includes a duty sensing circuit, and storage device that includes a memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0764US11336266B2Method of operating a system including a parameter monitoring circuitSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted May 17, 2022·0 cites·20 claims
- 0862US12073917B2Memory device that includes a duty correction circuit, memory controller that includes a duty sensing circuit, and storage device that includes a memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Aug 27, 2024·0 cites·19 claims
- 0948US2025239280A1Impedance calibration circuits and semiconductor memory devices including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1046US11915781B2Apparatuses and methods for ZQ calibrationSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Feb 27, 2024·0 cites·20 claims
- 1145US11581025B2High resolution ZQ calibration method using hidden least significant bit (HLSB)SAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 14, 2023·0 cites·20 claims
- 1244US2025273180A1Display DeviceLG DISPLAY CO LTD·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →