Inventor · disambiguated record
K. Paul Muller
Also filed as: MULLER K PAUL · MULLER K PAUL L · MULLER K PAUL LUDWIG
60 granted patents·5 pending applications·1,570 citations·filing 1992–2022
99Inventor score
Top patents by PatentIndex Score
65 records- 0199US6252284B1Planarized silicon fin deviceIBM·Filed 1999·Granted Jun 26, 2001·291 cites·7 claims
- 0298US7288445B2Double gated transistor and method of fabricationIBM·Filed 2005·Granted Oct 30, 2007·125 cites·3 claims
- 0396US7087477B2FinFET SRAM cell using low mobility plane for cell stability and method for formingIBM·Filed 2004·Granted Aug 8, 2006·120 cites·18 claims
- 0496US6967351B2Finfet SRAM cell using low mobility plane for cell stability and method for formingIBM·Filed 2001·Granted Nov 22, 2005·104 cites·13 claims
- 0596US6432754B1Double SOI device with recess etch and epitaxyIBM·Filed 2001·Granted Aug 13, 2002·141 cites·24 claims
- 0695US7645650B2Double gated transistor and method of fabricationIBM·Filed 2007·Granted Jan 12, 2010·29 cites·18 claims
- 0794US8925339B2Cooling system control and servicing based on time-based variation of an operational variableIBM·Filed 2013·Granted Jan 6, 2015·17 cites·12 claims
- 0893US6432829B2Process for making planarized silicon fin deviceIBM·Filed 2001·Granted Aug 13, 2002·76 cites·19 claims
- 0992US11235224B1Detecting and removing bias in subjective judgingIBM·Filed 2020·Granted Feb 1, 2022·4 cites·18 claims
- 1091US5312717AResidue free vertical pattern transfer with top surface imaging resistsIBM·Filed 1992·Granted May 17, 1994·78 cites·4 claims
- 1190US8129267B2Alpha particle blocking wire structure and method fabricating sameCABRAL JR CYRIL·Filed 2008·Granted Mar 6, 2012·19 cites·30 claims
- 1288US9136019B1Built-in testing of unused element on chipIBM·Filed 2014·Granted Sep 15, 2015·10 cites·9 claims
- 1388US8991198B2Cooling system control and servicing based on time-based variation of an operational variableKEARNEY DANIEL J·Filed 2012·Granted Mar 31, 2015·10 cites·19 claims
- 1487US6521949B2SOI transistor with polysilicon seedIBM·Filed 2001·Granted Feb 18, 2003·41 cites·2 claims
- 1585US7888959B2Apparatus and method for hardening latches in SOI CMOS devicesIBM·Filed 2007·Granted Feb 15, 2011·11 cites·4 claims
- 1685US7627836B2OPC trimming for performanceIBM·Filed 2005·Granted Dec 1, 2009·15 cites·7 claims
- 1784US8909383B2Proactive cooling of chips using workload information and controlsHADDERMAN SCOTT J·Filed 2011·Granted Dec 9, 2014·9 cites·15 claims
- 1884US6534351B2Gate-controlled, graded-extension device for deep sub-micron ultra-high-performance devicesIBM·Filed 2001·Granted Mar 18, 2003·34 cites·17 claims
- 1983US6774437B2Fin-based double poly dynamic threshold CMOS FET with spacer gate and method of fabricationIBM·Filed 2002·Granted Aug 10, 2004·28 cites·18 claims
- 2082US5891807AFormation of a bottle shaped trenchSIEMENS AG·Filed 1997·Granted Apr 6, 1999·63 cites·16 claims
- 2182US5877061AMethods for roughening and volume expansion of trench sidewalls to form high capacitance trench cell for high density dram applicationsIBM·Filed 1997·Granted Mar 2, 1999·65 cites·14 claims
- 2280US6537418B1Spatially uniform gas supply and pump configuration for large wafer diametersSIEMENS AG·Filed 1997·Granted Mar 25, 2003·63 cites·2 claims
- 2379US9912478B2Authenticating features of virtual server systemIBM·Filed 2015·Granted Mar 6, 2018·3 cites·20 claims
- 2477US9882901B2End-to-end protection for shrouded virtual serversIBM·Filed 2015·Granted Jan 30, 2018·2 cites·18 claims
- 2573US11150971B1Pattern recognition for proactive treatment of non-contiguous growing defectsIBM·Filed 2020·Granted Oct 19, 2021·1 cites·20 claims
- 2673US6960806B2Double gated vertical transistor with different first and second gate materialsIBM·Filed 2001·Granted Nov 1, 2005·13 cites·16 claims
- 2771US9041428B2Placement of storage cells on an integrated circuitIBM·Filed 2013·Granted May 26, 2015·3 cites·19 claims
- 2871US7491598B2CMOS circuits including a passive element having a low end resistanceIBM·Filed 2007·Granted Feb 17, 2009·3 cites·10 claims
- 2971US6645795B2Polysilicon doped transistor using silicon-on-insulator and double silicon-on-insulatorIBM·Filed 2001·Granted Nov 11, 2003·16 cites·10 claims
- 3070US6140833AIn-situ measurement method and apparatus for semiconductor processingSIEMENS AG·Filed 1998·Granted Oct 31, 2000·38 cites·22 claims
- 3169US10084598B2Authenticating features of virtual server systemIBM·Filed 2017·Granted Sep 25, 2018·1 cites·1 claims
- 3269US6913960B2Fin-based double poly dynamic threshold CMOS FET with spacer gate and method of fabricationIBM·Filed 2004·Granted Jul 5, 2005·12 cites·20 claims
- 3368US9569582B2Template matching for resilience and security characteristics of sub-component chip designsIBM·Filed 2014·Granted Feb 14, 2017·2 cites·20 claims
- 3466US9043683B2Error protection for integrated circuitsIBM·Filed 2013·Granted May 26, 2015·3 cites·15 claims
- 3564US9626220B2Computer system using partially functional processor coreIBM·Filed 2015·Granted Apr 18, 2017·1 cites·14 claims
- 3664US7683434B2Preventing cavitation in high aspect ratio dielectric regions of semiconductor deviceIBM·Filed 2008·Granted Mar 23, 2010·2 cites·7 claims
- 3763US9355746B2Built-in testing of unused element on chipIBM·Filed 2014·Granted May 31, 2016·2 cites·14 claims
- 3863US9104792B2Modular refrigeration unit health monitoringIBM·Filed 2013·Granted Aug 11, 2015·1 cites·8 claims
- 3961US6657261B2Ground-plane device with back oxide topographyIBM·Filed 2001·Granted Dec 2, 2003·9 cites·12 claims
- 4059US9165917B2In-line stacking of transistors for soft error rate hardeningCANNON ETHAN H·Filed 2009·Granted Oct 20, 2015·2 cites·11 claims
- 4158US9021328B2Shared error protection for register banksIBM·Filed 2013·Granted Apr 28, 2015·2 cites·11 claims
- 4256US5956142AMethod of end point detection using a sinusoidal interference signal for a wet etch processSIEMENS AG·Filed 1997·Granted Sep 21, 1999·20 cites·10 claims
- 4356US2015016486A1Remote electromigration monitoring of electronic chipsIBM·Filed 2014·Application pending·0 cites
- 4455US9998459B2End-to end protection for shrouded virtual serversIBM·Filed 2017·Granted Jun 12, 2018·0 cites·1 claims
- 4555US6278171B2Sublithographic fuses using a phase shift maskIBM·Filed 2000·Granted Aug 21, 2001·5 cites·5 claims
- 4655US5674409ANanolithographic method of forming fine linesIBM·Filed 1995·Granted Oct 7, 1997·19 cites·23 claims
- 4753US6291353B1Lateral patterningIBM·Filed 1999·Granted Sep 18, 2001·14 cites·20 claims
- 4853US2014278247A1Remote electromigration monitoring of electronic chipsIBM·Filed 2013·Application pending·0 cites
- 4952US2024184971A1Bit line alignment for the reduction of soft errorsIBM·Filed 2022·Application pending·0 cites
- 5050US8102033B2Reduced soft error rate through metal fill and placementMULLER K PAUL·Filed 2009·Granted Jan 24, 2012·1 cites·25 claims
Showing the top 50 of 65 patent records by PatentIndex Score.
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