Inventor · disambiguated record
Kazunori Ando
Also filed as: ANDO KAZUNORI
10 granted patents·1 pending application·159 citations·filing 2001–2016
89Inventor score
Files withHITACHI LTD4SII NANOTECHNOLOGY INC3HITACHI HIGH TECH SCIENCE CORP2ANDO KAZUNORI1SEIKO INSTR INC1
Top patents by PatentIndex Score
11 records- 0193US7098453B2Scanning probe microscopy system and method of measurement by the sameSII NANOTECHNOLOGY INC·Filed 2005·Granted Aug 29, 2006·39 cites·20 claims
- 0287US6461059B2Photo-electronic device and method of producing the sameHITACHI LTD·Filed 2001·Granted Oct 8, 2002·48 cites·16 claims
- 0381US9865425B2Sample holder and sample holder setHITACHI HIGH-TECH SCIENCE CORP·Filed 2016·Granted Jan 9, 2018·2 cites·3 claims
- 0478US6476379B2Optoelectronic devices and manufacturing method thereofHITACHI LTD·Filed 2001·Granted Nov 5, 2002·22 cites·20 claims
- 0575US9689893B2Scanning probe microscopeHITACHI HIGH-TECH SCIENCE CORP·Filed 2016·Granted Jun 27, 2017·2 cites·16 claims
- 0669US6941798B2Scanning probe microscope and operation methodSII NANOTECHNOLOGY INC·Filed 2003·Granted Sep 13, 2005·18 cites·11 claims
- 0767US6443632B2Photo-electronic device and method of producing the sameHITACHI LTD·Filed 2001·Granted Sep 3, 2002·13 cites·17 claims
- 0860US8608373B2Softening point measuring apparatus and thermal conductivity measuring apparatusANDO KAZUNORI·Filed 2010·Granted Dec 17, 2013·1 cites·12 claims
- 0958US7251987B2Scanning probe microscope and measuring method by means of the sameSII NANOTECHNOLOGY INC·Filed 2005·Granted Aug 7, 2007·2 cites·15 claims
- 1057US6596992B2Method of operating scanning probe microscopeSEIKO INSTR INC·Filed 2001·Granted Jul 22, 2003·12 cites·20 claims
- 1148US2004172541A1IC card having security controlHITACHI LTD·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →