Inventor · disambiguated record
Kai-Ling Chiu
Also filed as: CHIU KAI-LING
12 granted patents·1 pending application·58 citations·filing 2008–2022
87Inventor score
Files withCHIU KAI-LING4UNITED MICROELECTRONICS CORP4TAIWAN SEMICONDUCTOR MFG CO LTD2CHENG CHAO-SHENG1NAVITAS SEMICONDUCTOR LTD1
Top patents by PatentIndex Score
13 records- 0192US8558346B1Semiconductor structureCHENG CHAO-SHENG·Filed 2012·Granted Oct 15, 2013·36 cites·16 claims
- 0277US7803687B2Method for forming a thin film resistorUNITED MICROELECTRONICS CORP·Filed 2008·Granted Sep 28, 2010·8 cites·20 claims
- 0370US8637936B2Metal gate transistor with resistorCHIU KAI-LING·Filed 2009·Granted Jan 28, 2014·5 cites·20 claims
- 0470US8027144B2Capacitor structureUNITED MICROELECTRONICS CORP·Filed 2009·Granted Sep 27, 2011·5 cites·15 claims
- 0568US9041155B2Semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2013·Granted May 26, 2015·2 cites·4 claims
- 0666US9277195B2Pixel array with clear and color pixels exhibiting improved blooming performanceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Mar 1, 2016·1 cites·20 claims
- 0757US8664705B2Metal-oxide-semiconductor capacitorCHIU KAI-LING·Filed 2012·Granted Mar 4, 2014·1 cites·7 claims
- 0852US9048126B2Methods for measuring the full well capacity of CMOS image sensorsTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jun 2, 2015·0 cites·20 claims
- 0950US7804154B2Semiconductor device structure and fabricating method thereofUNITED MICROELECTRONICS CORP·Filed 2008·Granted Sep 28, 2010·0 cites·10 claims
- 1048US9543222B2Methods for measuring the full well capacity of CMOS image sensorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jan 10, 2017·0 cites·20 claims
- 1148US2023013188A1System and methods for singulation of gan-on-silicon wafersNAVITAS SEMICONDUCTOR LTD·Filed 2022·Application pending·0 cites
- 1242US8716802B2Semiconductor device structure and fabricating method thereofCHIU KAI-LING·Filed 2010·Granted May 6, 2014·0 cites·7 claims
- 1342US8477475B2Capacitor structureCHIU KAI-LING·Filed 2011·Granted Jul 2, 2013·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →