Inventor · disambiguated record
Katharina Gries
Also filed as: GRIES KATHARINA
1 granted patent·2 pending applications·0 citations·filing 2020–2025
3Inventor score
Top patents by PatentIndex Score
3 records- 0152US2025183000A1Method of characterizing a fault in a scanning electron microscopeZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0248US2025029808A1Valves for charged particle beam microscope, valve member and charged particle beam microscopeCARL ZEISS MULTISEM GMBH·Filed 2024·Application pending·0 cites
- 0332US11961705B2Method and apparatus for examining a beam of charged particlesHoinkis Elke·Filed 2020·Granted Apr 16, 2024·0 cites·39 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →