Inventor · disambiguated record
Kazuhisa Hasumi
Also filed as: HASUMI KAZUHISA
12 granted patents·2 pending applications·97 citations·filing 1982–2022
88Inventor score
Top patents by PatentIndex Score
14 records- 0190US4470396AInternal combustion engine control system with means for reshaping of command from driver's foot pedalMIKUNI KOGYO KK·Filed 1982·Granted Sep 11, 1984·35 cites·7 claims
- 0288US8595666B2Semiconductor defect classifying method, semiconductor defect classifying apparatus, and semiconductor defect classifying programHAYAKAWA KOICHI·Filed 2010·Granted Nov 26, 2013·10 cites·24 claims
- 0380US8670115B2Inspection method and inspection apparatusMIYOSHI YUJI·Filed 2009·Granted Mar 11, 2014·7 cites·18 claims
- 0474US10724856B2Image analysis apparatus and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Jul 28, 2020·2 cites·6 claims
- 0569US5618496AGas sensors and their manufacturing methodsYANAGIDA HIROAKI·Filed 1995·Granted Apr 8, 1997·40 cites·15 claims
- 0663US10672119B2Inspection deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Jun 2, 2020·1 cites·10 claims
- 0753US2025362255A1Charged Particle Beam System and Sample Evaluation Information Generation MethodHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 0849US10854420B2Pattern evaluation deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Dec 1, 2020·0 cites·6 claims
- 0949US9831062B2Method for pattern measurement, method for setting device parameters of charged particle radiation device, and charged particle radiation deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Nov 28, 2017·0 cites·10 claims
- 1047US11713963B2Pattern shape evaluation device, pattern shape evaluation system, and pattern shape evaluation methodHITACHI HIGH TECH CORP·Filed 2019·Granted Aug 1, 2023·0 cites·16 claims
- 1146US11430106B2Image processing device, image processing method and charged particle microscopeHITACHI HIGH TECH CORP·Filed 2017·Granted Aug 30, 2022·0 cites·4 claims
- 1241US10295339B2Pattern measurement method and measurement apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted May 21, 2019·0 cites·8 claims
- 1336US2014177940A1Recipe generation apparatus, inspection support apparatus, inspection system, and recording mediaNAKAGAKI RYO·Filed 2011·Application pending·0 cites
- 1432US6087924AGas sensors and methods of manufacturing the sameMIKUNI KOGYO KK·Filed 1997·Granted Jul 11, 2000·2 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →