Inventor · disambiguated record
Kazumi Hatayama
Also filed as: HATAYAMA KAZUMI
10 granted patents·1 pending application·181 citations·filing 1984–2003
91Inventor score
Top patents by PatentIndex Score
11 records- 0176US6922803B2Test method of semiconductor intergrated circuit and test pattern generatorHITACHI INFORMATION TECHNOLOGY·Filed 2001·Granted Jul 26, 2005·23 cites·12 claims
- 0273US6484294B1Semiconductor integrated circuit and method of designing the sameHITACHI LTD·Filed 1999·Granted Nov 19, 2002·35 cites·7 claims
- 0372US7036060B2Semiconductor integrated circuit and its analyzing methodHITACHI LTD·Filed 2003·Granted Apr 25, 2006·17 cites·3 claims
- 0469US6038691AMethod of analyzing logic circuit test points, apparatus for analyzing logic circuit test points and semiconductor integrated circuit with test pointsHITACHI LTD·Filed 1998·Granted Mar 14, 2000·31 cites·21 claims
- 0568US4613970AIntegrated circuit device and method of diagnosing the sameHITACHI LTD·Filed 1984·Granted Sep 23, 1986·21 cites·10 claims
- 0657US6640198B2Semiconductor device having self test functionHITACHI LTD·Filed 2001·Granted Oct 28, 2003·11 cites·12 claims
- 0755US5329532ALogic circuit with additional circuit for carrying out delay testHITACHI LTD·Filed 1991·Granted Jul 12, 1994·18 cites·9 claims
- 0850US4710930AMethod and apparatus for diagnosing a LSI chipHITACHI LTD·Filed 1986·Granted Dec 1, 1987·12 cites·9 claims
- 0946US4956818AMemory incorporating logic LSI and method for testing the same LSIHITACHI LTD·Filed 1988·Granted Sep 11, 1990·10 cites·12 claims
- 1033US2003070118A1Semiconductor integrated circuit with built-in test functionHITACHI LTD·Filed 2002·Application pending·0 cites
- 1130US6317853B1Apparatus for making test data and method thereofHITACHI LTD·Filed 1997·Granted Nov 13, 2001·3 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →