Inventor · disambiguated record
Kazutoshi Inoue
Also filed as: INOUE KAZUTOSHI
24 granted patents·1 pending application·851 citations·filing 1984–2024
96Inventor score
Files withOKI ELECTRIC IND CO LTD8SUPER SILICON CRYSTAL RES INST4INOUE KAZUTOSHI2LAPIS SEMICONDUCTOR CO LTD2SONY CORP2
Top patents by PatentIndex Score
25 records- 0196US6578589B1Apparatus for manufacturing semiconductor waferSUPER SILICON CRYSTAL RES INST·Filed 2000·Granted Jun 17, 2003·516 cites·3 claims
- 0295US5585574AShaft having a magnetostrictive torque sensor and a method for making sameMITSUBISHI MATERIALS CORP·Filed 1994·Granted Dec 17, 1996·96 cites·16 claims
- 0387US6967397B2Test circuit and multi-chip package type semiconductor device having the test circuitOKI ELECTRIC IND CO LTD·Filed 2003·Granted Nov 22, 2005·32 cites·4 claims
- 0486US7315970B2Semiconductor device to improve data retention characteristics of DRAMSONY CORP·Filed 2005·Granted Jan 1, 2008·18 cites·15 claims
- 0581US6245152B1Method and apparatus for producing epitaxial waferSUPER SILICON CRYSTAL RES INST·Filed 1997·Granted Jun 12, 2001·43 cites·11 claims
- 0679US8836341B2Semiconductor circuit, semiconductor device, method of diagnosing abnormality of wire, and computer readable storage mediumINOUE KAZUTOSHI·Filed 2011·Granted Sep 16, 2014·5 cites·8 claims
- 0778US6262393B1Epitaxial growth furnaceSUPER SILICON CRYSTAL RES INST·Filed 1998·Granted Jul 17, 2001·48 cites·7 claims
- 0875US6762486B2Test circuit and multi-chip package type semiconductor device having the test circuitOKI ELECTRIC IND CO LTD·Filed 2001·Granted Jul 13, 2004·16 cites·4 claims
- 0974US7230861B2Semiconductor integrated circuitSONY CORP·Filed 2005·Granted Jun 12, 2007·9 cites·13 claims
- 1064US9453881B2Oscillation circuit, integrated circuit, and abnormality detection methodLAPIS SEMICONDUCTOR CO LTD·Filed 2013·Granted Sep 27, 2016·2 cites·7 claims
- 1162US2025105661A1Redundant power supply systemTOYOTA MOTOR CO LTD·Filed 2024·Application pending·0 cites
- 1260US12221086B2Power supply systemTOYOTA MOTOR CO LTD·Filed 2023·Granted Feb 11, 2025·0 cites·4 claims
- 1360US4618298AMethod for constructing an enlarged tunnel and apparatus for forming the sameMITSUI CONSTR·Filed 1984·Granted Oct 21, 1986·13 cites·13 claims
- 1455US6897554B2Test circuit and multi-chip package type semiconductor device having the test circuitOKI ELECTRIC IND CO LTD·Filed 2003·Granted May 24, 2005·4 cites·6 claims
- 1552US7058842B2Microcontroller with multiple function blocks and clock signal controlOKI ELECTRIC IND CO LTD·Filed 2003·Granted Jun 6, 2006·2 cites·7 claims
- 1649US6163015ASubstrate support elementMOORE EPITAXIAL INC·Filed 1999·Granted Dec 19, 2000·14 cites·8 claims
- 1748US8412902B2Signal processor and signal processing systemINOUE KAZUTOSHI·Filed 2009·Granted Apr 2, 2013·0 cites·6 claims
- 1847US5936448AIntegrated circuit having independently testable input-output circuits and test method thereforOKI ELECTRIC IND CO LTD·Filed 1997·Granted Aug 10, 1999·13 cites·10 claims
- 1946US6885094B2Test circuit and multi-chip package type semiconductor device having the test circuitOKI ELECTRIC IND CO LTD·Filed 2003·Granted Apr 26, 2005·1 cites·4 claims
- 2044US9128831B2Electrical device and method of setting addressLAPIS SEMICONDUCTOR CO LTD·Filed 2013·Granted Sep 8, 2015·0 cites·8 claims
- 2144US7820554B2Method for unloading thermally treated non-planar silicon wafers with a conveying bladeSUMCO CORP·Filed 2006·Granted Oct 26, 2010·0 cites·3 claims
- 2242US6885095B2Test circuit and multi-chip package type semiconductor device having the test circuitOKI ELECTRIC IND CO LTD·Filed 2003·Granted Apr 26, 2005·0 cites·2 claims
- 2339US6323140B1Method of manufacturing semiconductor waferSILICON CRYSTAL RES INST CORP·Filed 1999·Granted Nov 27, 2001·9 cites·4 claims
- 2437US6863735B1Epitaxial growth furnaceSUPER SILICON CRYSTAL RES INST·Filed 1999·Granted Mar 8, 2005·7 cites·4 claims
- 2531US6229369B1Clock control circuitOKI ELECTRIC IND CO LTD·Filed 1999·Granted May 8, 2001·3 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →