Inventor · disambiguated record
Kazuyuki Masukawa
Also filed as: MASUKAWA KAZUYUKI
16 granted patents·7 pending applications·41 citations·filing 2007–2024
90Inventor score
Files withTOSHIBA KK10TECH RES ASSOCIATION FUTURE ADDITIVE MANUFACTURING7FUKUHARA KAZUYA2INOUE AI1KIOXIA CORP1
Top patents by PatentIndex Score
23 records- 0191US9959613B2Optical Processing head, optical processing apparatus, and control method and control program of optical processing apparatusTECH RES ASSOCIATION FUTURE ADDITIVE MANUFACTURING·Filed 2015·Granted May 1, 2018·4 cites·21 claims
- 0290US10449560B2Optical processing nozzle and optical machining apparatusTECH RES ASSOCIATION FUTURE ADDITIVE MANUFACTURING·Filed 2015·Granted Oct 22, 2019·4 cites·11 claims
- 0383US10369661B2Optical processing head, optical machining apparatus, and optical processing methodTECH RES ASSOCIATION FUTURE ADDITIVE MANUFACTURING·Filed 2015·Granted Aug 6, 2019·2 cites·9 claims
- 0482US10537966B2Processing nozzle, processing head, machining apparatus, and control method and control program of processing nozzleTECH RES ASSOCIATION FUTURE ADDITIVE MANUFACTURING·Filed 2015·Granted Jan 21, 2020·2 cites·7 claims
- 0582US7934175B2Parameter adjustment method, semiconductor device manufacturing method, and recording mediumTOSHIBA KK·Filed 2008·Granted Apr 26, 2011·8 cites·20 claims
- 0680US8293456B2Semiconductor device manufacturing methodFUKUHARA KAZUYA·Filed 2009·Granted Oct 23, 2012·5 cites·7 claims
- 0772US7998642B2Mask pattern data creation method and maskTOSHIBA KK·Filed 2009·Granted Aug 16, 2011·3 cites·15 claims
- 0872US7851914B2Semiconductor integrated circuit deviceTOSHIBA KK·Filed 2009·Granted Dec 14, 2010·5 cites·10 claims
- 0972US7517621B2Exposure method and method for manufacturing semiconductor deviceTOSHIBA KK·Filed 2007·Granted Apr 14, 2009·3 cites·20 claims
- 1071US10532427B2Optical processing head, optical machining apparatus, and control method and control program of optical processing headTECH RES ASSOCIATION FUTURE ADDITIVE MANUFACTURING·Filed 2015·Granted Jan 14, 2020·2 cites·13 claims
- 1168US9086634B2Production method and evaluation apparatus for mask layoutTOSHIBA KK·Filed 2013·Granted Jul 21, 2015·1 cites·11 claims
- 1260US8912089B2Method for manufacturing a semiconductor device including a stacked body comprising pluralities of first and second metallic conductive layersTOSHIBA KK·Filed 2013·Granted Dec 16, 2014·1 cites·17 claims
- 1359US9257367B2Integrated circuit device, method for producing mask layout, and program for producing mask layoutTOSHIBA KK·Filed 2013·Granted Feb 9, 2016·1 cites·9 claims
- 1459US2025085102A1Measurement device and measurement methodKIOXIA CORP·Filed 2024·Application pending·0 cites
- 1552US8679731B2Semiconductor device manufacturing methodFUKUHARA KAZUYA·Filed 2012·Granted Mar 25, 2014·0 cites·8 claims
- 1646US10371645B2Optical processing head, optical processing apparatus, and control method and control program of optical processing apparatusTECH RES ASSOCIATION FUTURE ADDITIVE MANUFACTURING·Filed 2015·Granted Aug 6, 2019·0 cites·10 claims
- 1746US8956791B2Exposure tolerance estimation method and method for manufacturing semiconductor deviceTOSHIBA KK·Filed 2013·Granted Feb 17, 2015·0 cites·20 claims
- 1846US2009142706A1Method of manufacturing semiconductor deviceMASUKAWA KAZUYUKI·Filed 2008·Application pending·0 cites
- 1942US2018147666A1Optical processing head and optical processing apparatusTECH RES ASSOCIATION FUTURE ADDITIVE MANUFACTURING·Filed 2016·Application pending·0 cites
- 2041US2009246954A1Method of manufacturing semiconductor deviceMIYOSHI SEIRO·Filed 2009·Application pending·0 cites
- 2140US2015220846A1Process conversion difference prediction device, process conversion difference prediction method, and non-transitory computer-readable recording medium containing a process conversion difference prediction programTOSHIBA KK·Filed 2014·Application pending·0 cites
- 2238US2013024825A1Mask data generation method, mask generation method, and recording mediumTOSHIBA KK·Filed 2012·Application pending·0 cites
- 2335US2013045607A1Pattern generating apparatus, pattern generating program, and method for fabricating semiconductor deviceINOUE AI·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →