Inventor · disambiguated record
Katsuaki Natori
Also filed as: NATORI KATSUAKI
52 granted patents·24 pending applications·376 citations·filing 1993–2025
98Inventor score
Top patents by PatentIndex Score
76 records- 0196US8604573B2Semiconductor memory deviceYAMAKAWA KOJI·Filed 2012·Granted Dec 10, 2013·45 cites·11 claims
- 0296US7999304B2Semiconductor deviceTOSHIBA KK·Filed 2008·Granted Aug 16, 2011·52 cites·8 claims
- 0395US8587043B2Magnetoresistive random access memory and method of manufacturing the sameNATORI KATSUAKI·Filed 2011·Granted Nov 19, 2013·46 cites·8 claims
- 0491US8110865B2Semiconductor device and method for manufacturing the sameTANAKA MASAYUKI·Filed 2010·Granted Feb 7, 2012·12 cites·5 claims
- 0588US7723772B2Semiconductor memory device and method of manufacturing the sameTOSHIBA KK·Filed 2007·Granted May 25, 2010·11 cites·8 claims
- 0687US5442585ADevice having dielectric thin filmTOSHIBA KK·Filed 1993·Granted Aug 15, 1995·64 cites·20 claims
- 0786US2025365961A1Semiconductor device, semiconductor device manufacturing method, and semiconductor device manufacturing apparatusKIOXIA CORP·Filed 2025·Application pending·0 cites
- 0885US7294878B2Semiconductor memory device and method of manufacturing the sameTOSHIBA KK·Filed 2005·Granted Nov 13, 2007·13 cites·8 claims
- 0982US7612404B2Semiconductor deviceTOSHIBA KK·Filed 2007·Granted Nov 3, 2009·10 cites·20 claims
- 1081US7927949B2Semiconductor memory device and method of manufacturing the sameTOSHIBA KK·Filed 2010·Granted Apr 19, 2011·5 cites·6 claims
- 1179US8982614B2Magnetoresistive effect element and manufacturing method thereofTOSHIBA KK·Filed 2013·Granted Mar 17, 2015·3 cites·11 claims
- 1278US9196823B2Magnetoresistive effect elementTOSHIBA KK·Filed 2013·Granted Nov 24, 2015·6 cites·16 claims
- 1378US8653614B2Semiconductor memory device and method for manufacturing the sameIKENO DAISUKE·Filed 2012·Granted Feb 18, 2014·6 cites·10 claims
- 1476US11139173B2Production method of semiconductor deviceTOSHIBA MEMORY CORP·Filed 2018·Granted Oct 5, 2021·2 cites·15 claims
- 1576US8008152B2Method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2007·Granted Aug 30, 2011·4 cites·10 claims
- 1675US12507413B2Semiconductor device, semiconductor device manufacturing method, and semiconductor device manufacturing apparatusKIOXIA CORP·Filed 2023·Granted Dec 23, 2025·0 cites·3 claims
- 1775US9312271B2Non-volatile memory device and method for manufacturing sameTOSHIBA KK·Filed 2015·Granted Apr 12, 2016·2 cites·12 claims
- 1874US7501675B2Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2005·Granted Mar 10, 2009·6 cites·17 claims
- 1973US7682899B2Method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2007·Granted Mar 23, 2010·3 cites·8 claims
- 2073US7635891B2Semiconductor deviceTOSHIBA KK·Filed 2007·Granted Dec 22, 2009·5 cites·20 claims
- 2173US6459111B1Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2000·Granted Oct 1, 2002·15 cites·6 claims
- 2270US7190015B2Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2004·Granted Mar 13, 2007·14 cites·14 claims
- 2369US8710604B2Magnetoresistive element and manufacturing method of the sameYAMAKAWA KOJI·Filed 2012·Granted Apr 29, 2014·3 cites·3 claims
- 2467US7573120B2Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2005·Granted Aug 11, 2009·2 cites·9 claims
- 2566US9196335B2Magnetic memoryTOSHIBA KK·Filed 2013·Granted Nov 24, 2015·1 cites·21 claims
- 2666US7521263B2Method of forming an insulating film, method of manufacturing a semiconductor device, and semiconductor deviceTOSHIBA KK·Filed 2005·Granted Apr 21, 2009·2 cites·14 claims
- 2765US8609487B2Method of manufacturing semiconductor deviceNATORI KATSUAKI·Filed 2010·Granted Dec 17, 2013·2 cites·7 claims
- 2865US7368780B2Semiconductor memory device and method of manufacturing the sameTOSHIBA KK·Filed 2007·Granted May 6, 2008·4 cites·1 claims
- 2964US7531408B2Method of manufacturing a semiconductor device containing a PbxSr(1-x)[Zr,Ti]xRu(1-x)O3 film in a capacitorTOSHIBA KK·Filed 2007·Granted May 12, 2009·1 cites·5 claims
- 3063US8410529B2Magnetic random access memory and method of fabricating the sameIKENO DAISUKE·Filed 2011·Granted Apr 2, 2013·1 cites·19 claims
- 3163US7714373B2Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2007·Granted May 11, 2010·2 cites·12 claims
- 3262US7635890B2Semiconductor deviceTOSHIBA KK·Filed 2007·Granted Dec 22, 2009·2 cites·12 claims
- 3362US2021305275A1Semiconductor device, semiconductor device manufacturing method, and semiconductor device manufacturing apparatusKIOXIA CORP·Filed 2020·Application pending·0 cites
- 3461US11282681B2Semiconductor manufacturing apparatus and method of manufacturing semiconductor deviceKIOXIA CORP·Filed 2019·Granted Mar 22, 2022·0 cites·10 claims
- 3561US7122851B2Semiconductor device with perovskite capacitorTOSHIBA KK·Filed 2004·Granted Oct 17, 2006·9 cites·14 claims
- 3660US12010845B2Method for manufacturing semiconductor deviceKIOXIA CORP·Filed 2021·Granted Jun 11, 2024·0 cites·20 claims
- 3759US6924519B2Semiconductor device with perovskite capacitorINFINEON TECHNOLOGIES AG·Filed 2003·Granted Aug 2, 2005·8 cites·22 claims
- 3857US8741161B2Method of manufacturing semiconductor deviceSONODA YASUYUKI·Filed 2012·Granted Jun 3, 2014·1 cites·16 claims
- 3956US9231192B2Semiconductor memory device and method for manufacturing the sameTOSHIBA KK·Filed 2014·Granted Jan 5, 2016·1 cites·12 claims
- 4054US11699731B2Semiconductor device and manufacturing method thereofKIOXIA CORP·Filed 2020·Granted Jul 11, 2023·0 cites·14 claims
- 4154US11127681B2Three-dimensional memory including molybdenum wiring layer having oxygen impurity and method for manufacturing the sameTOSHIBA MEMORY CORP·Filed 2019·Granted Sep 21, 2021·0 cites·16 claims
- 4254US9735347B2Magnetic memory device and method of manufacturing the sameTOSHIBA KK·Filed 2016·Granted Aug 15, 2017·1 cites·13 claims
- 4354US9070866B2Magnetoresistive effect element and manufacturing method thereofTOSHIBA KK·Filed 2013·Granted Jun 30, 2015·0 cites·6 claims
- 4452US7105400B2Manufacturing method of semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2003·Granted Sep 12, 2006·4 cites·7 claims
- 4551US8278697B2Semiconductor device and method for manufacturing the sameTANAKA MASAYUKI·Filed 2012·Granted Oct 2, 2012·0 cites·5 claims
- 4650US7259094B2Apparatus and method for heat treating thin filmTOSHIBA KK·Filed 2005·Granted Aug 21, 2007·0 cites·15 claims
- 4749US7405133B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2005·Granted Jul 29, 2008·0 cites·5 claims
- 4849US7091538B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2004·Granted Aug 15, 2006·3 cites·20 claims
- 4949US2017040340A1Semiconductor memory device and method for manufacturing the sameTOSHIBA KK·Filed 2016·Application pending·0 cites
- 5048US7233040B2Semiconductor device contains a PbxSr(1−x)[Zr, Ti]xRu(1−x)O3 film in a capacitorTOSHIBA KK·Filed 2004·Granted Jun 19, 2007·1 cites·25 claims
Showing the top 50 of 76 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →