Inventor · disambiguated record
Kazuhiko Omote
Also filed as: OMOTE KAZUHIKO
51 granted patents·7 pending applications·512 citations·filing 1999–2025
98Inventor score
Top patents by PatentIndex Score
58 records- 0198US11733185B2Fluorescent X-ray analysis apparatus comprising a plurality of X-ray detectors and an X-ray irradiation unit including a multi-wavelength mirrorRIGAKU DENKI CO LTD·Filed 2020·Granted Aug 22, 2023·12 cites·6 claims
- 0296US9020101B2Target for X-ray generator, method of manufacturing the same and X-ray generatorRIGAKU DENKI CO LTD·Filed 2013·Granted Apr 28, 2015·36 cites·12 claims
- 0395US10473598B2X-ray thin film inspection deviceRIGAKU DENKI CO LTD·Filed 2014·Granted Nov 12, 2019·33 cites·19 claims
- 0495US10429325B2X-ray small angle optical systemRIGAKU DENKI CO LTD·Filed 2016·Granted Oct 1, 2019·11 cites·10 claims
- 0594US10514345B2X-ray thin film inspection deviceRIGAKU DENKI CO LTD·Filed 2014·Granted Dec 24, 2019·22 cites·10 claims
- 0693US10302579B2Grazing incidence x-ray fluorescence spectrometer and grazing incidence x-ray fluorescence analyzing methodRIGAKU DENKI CO LTD·Filed 2017·Granted May 28, 2019·5 cites·7 claims
- 0793US9335282B2X-ray topography apparatusRIGAKU DENKI CO LTD·Filed 2013·Granted May 10, 2016·15 cites·6 claims
- 0893US7130373B2Method and apparatus for film thickness measurementRIGAKU DENKI CO LTD·Filed 2005·Granted Oct 31, 2006·42 cites·7 claims
- 0993US7035373B2X-ray diffraction apparatusRIGAKU DENKI CO LTD·Filed 2004·Granted Apr 25, 2006·45 cites·7 claims
- 1090US9658174B2X-ray topography apparatusRIGAKU DENKI CO LTD·Filed 2014·Granted May 23, 2017·10 cites·6 claims
- 1190US9336917B2X-ray apparatus, method of using the same and X-ray irradiation methodOZAWA TETSUYA·Filed 2010·Granted May 10, 2016·12 cites·12 claims
- 1289US10145808B2Beam generation unit and X-ray small-angle scattering apparatusRIGAKU DENKI CO LTD·Filed 2015·Granted Dec 4, 2018·4 cites·16 claims
- 1389US7257192B2Method and apparatus for X-ray reflectance measurementRIGAKU DENKI CO LTD·Filed 2005·Granted Aug 14, 2007·16 cites·5 claims
- 1488US11079345B2X-ray inspection deviceRIGAKU DENKI CO LTD·Filed 2018·Granted Aug 3, 2021·4 cites·8 claims
- 1588US8908830B2Surface microstructure measurement method, surface microstructure measurement data analysis method and X-ray scattering measurement deviceOMOTE KAZUHIKO·Filed 2010·Granted Dec 9, 2014·11 cites·15 claims
- 1688US6459763B1Combinatorial X-ray diffractorJAPAN SCIENCE & TECH CORP·Filed 2000·Granted Oct 1, 2002·37 cites·16 claims
- 1786US10876978B2X-ray inspecting device, X-ray thin film inspecting method, and method for measuring rocking curveRIGAKU DENKI CO LTD·Filed 2017·Granted Dec 29, 2020·8 cites·10 claims
- 1884US10983073B2Hybrid inspection systemRIGAKU DENKI CO LTD·Filed 2017·Granted Apr 20, 2021·3 cites·18 claims
- 1983US12222303B2Transmissive small-angle scattering deviceRIGAKU DENKI CO LTD·Filed 2023·Granted Feb 11, 2025·0 cites·5 claims
- 2083US12019036B2Transmissive small-angle scattering deviceRIGAKU DENKI CO LTD·Filed 2023·Granted Jun 25, 2024·0 cites·3 claims
- 2183US10964439B2Soller slit, X-ray diffraction apparatus, and methodRIGAKU DENKI CO LTD·Filed 2018·Granted Mar 30, 2021·2 cites·6 claims
- 2282US10436723B2X-ray diffractometer with multilayer reflection-type monochromatorRIGAKU DENKI CO LTD·Filed 2015·Granted Oct 8, 2019·2 cites·12 claims
- 2382US8085900B2Method for X-ray wavelength measurement and X-ray wavelength measurement apparatusOMOTE KAZUHIKO·Filed 2009·Granted Dec 27, 2011·13 cites·16 claims
- 2480US11408837B2Analysis method for fine structure, and apparatus and program thereofRIGAKU DENKI CO LTD·Filed 2020·Granted Aug 9, 2022·1 cites·8 claims
- 2580US11131637B2Analysis method for fine structure, apparatus, and programRIGAKU DENKI CO LTD·Filed 2020·Granted Sep 28, 2021·1 cites·11 claims
- 2680US7039161B2Method for analyzing film structure and apparatus thereforRIGAKU DENKI CO LTD·Filed 2004·Granted May 2, 2006·16 cites·6 claims
- 2775US6249566B1Apparatus for x-ray analysisRIGAKU DENKI CO LTD·Filed 1999·Granted Jun 19, 2001·37 cites·29 claims
- 2874US6873681B2Method of estimating preferred orientation of polycrystalline materialRIGAKU DENKI CO LTD·Filed 2003·Granted Mar 29, 2005·12 cites·9 claims
- 2973US12399141B2Damage measurement method, apparatus and program, and x-ray diffraction apparatusRIGAKU DENKI CO LTD·Filed 2023·Granted Aug 26, 2025·0 cites·19 claims
- 3073US9159524B2X-ray generating apparatusRIGAKU DENKI CO LTD·Filed 2013·Granted Oct 13, 2015·3 cites·10 claims
- 3173US7221734B2Method for X-ray reflectance measurementRIGAKU DENKI CO LTD·Filed 2005·Granted May 22, 2007·3 cites·8 claims
- 3273US6970532B2Method and apparatus for measuring thin film, and thin film deposition systemRIGAKU DENKI CO LTD·Filed 2001·Granted Nov 29, 2005·13 cites·5 claims
- 3373US6937694B2Pole measuring methodRIGAKU DENKI CO LTD·Filed 2000·Granted Aug 30, 2005·13 cites·3 claims
- 3472US6385281B1Fluorescent x-ray analyzing method and apprartusRIGAKU DENKI CO LTD·Filed 2000·Granted May 7, 2002·10 cites·20 claims
- 3572US6307917B1Soller slit and X-ray apparatusRIGAKU DENKI CO LTD·Filed 1999·Granted Oct 23, 2001·29 cites·5 claims
- 3672US2025077722A1Calculation apparatus, method and programRIGAKU DENKI CO LTD·Filed 2024·Application pending·0 cites
- 3771US10854348B2X-ray generator and x-ray analysis deviceRIGAKU DENKI CO LTD·Filed 2019·Granted Dec 1, 2020·2 cites·5 claims
- 3871US7116755B2Non-uniform density sample analyzing method, device and systemRIGAKU DENKI CO LTD·Filed 2002·Granted Oct 3, 2006·9 cites·6 claims
- 3968US11754515B2Transmissive small-angle scattering deviceRIGAKU DENKI CO LTD·Filed 2020·Granted Sep 12, 2023·0 cites·6 claims
- 4068US9086367B2X-ray intensity correction method and X-ray diffractometerRIGAKU DENKI CO LTD·Filed 2012·Granted Jul 21, 2015·1 cites·10 claims
- 4168US6920200B2Density-nonuniform multilayer film analyzing method, and apparatus and system thereofRIGAKU DENKI CO LTD·Filed 2003·Granted Jul 19, 2005·7 cites·12 claims
- 4266US2025362256A1X-ray optical device and x-ray photoelectron spectroscopyRIGAKU DENKI CO LTD·Filed 2025·Application pending·0 cites
- 4364US8767918B2X-ray scattering measurement device and X-ray scattering measurement methodOMOTE KAZUHIKO·Filed 2010·Granted Jul 1, 2014·2 cites·16 claims
- 4464US7342997B2Method for measuring dead time of X-ray detectorRIGAKU DENKI CO LTD·Filed 2006·Granted Mar 11, 2008·5 cites·20 claims
- 4563US7248669B2Method for analyzing membrane structure and apparatus thereforRIGAKU DENKI CO LTD·Filed 2004·Granted Jul 24, 2007·4 cites·10 claims
- 4658US11885753B2Imaging type X-ray microscopeRIGAKU DENKI CO LTD·Filed 2021·Granted Jan 30, 2024·0 cites·5 claims
- 4758US11867646B2Total reflection x-ray fluorescence spectrometerRIGAKU DENKI CO LTD·Filed 2021·Granted Jan 9, 2024·0 cites·8 claims
- 4858US2025251355A1Semiconductor inspection apparatus, semiconductor inspection system and semiconductor inspection methodRIGAKU DENKI CO LTD·Filed 2023·Application pending·0 cites
- 4956US2025245402A1Calculation apparatus, system, method, and programRIGAKU DENKI CO LTD·Filed 2025·Application pending·0 cites
- 5054US12175173B2Scattering measurement analysis method, scattering measurement analysis device, and non-transitory computer-readable storage medium storing scattering measurement analysis programRIGAKU DENKI CO LTD·Filed 2020·Granted Dec 24, 2024·0 cites·4 claims
Showing the top 50 of 58 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →