Inventor · disambiguated record
Kaoru Sakai
Also filed as: SAKAI KAORU
50 granted patents·18 pending applications·827 citations·filing 1994–2023
99Inventor score
Files withHITACHI LTD19SAKAI KAORU17HITACHI HIGH TECH CORP13HITACHI POWER SOLUTIONS CO LTD4MAEDA SHUNJI3
Top patents by PatentIndex Score
68 records- 0198US7388979B2Method and apparatus for inspecting pattern defectsHITACHI HIGH TECH CORP·Filed 2004·Granted Jun 17, 2008·136 cites·22 claims
- 0297US7664608B2Defect inspection method and apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Feb 16, 2010·37 cites·26 claims
- 0395US8005292B2Method and apparatus for inspecting pattern defectsHITACHI HIGH TECH CORP·Filed 2010·Granted Aug 23, 2011·17 cites·10 claims
- 0495US7127126B2Image alignment method, comparative inspection method, and comparative inspection device for comparative inspectionsHITACHI LTD·Filed 2005·Granted Oct 24, 2006·29 cites·14 claims
- 0594US6799130B2Inspection method and its apparatus, inspection systemHITACHI LTD·Filed 2002·Granted Sep 28, 2004·56 cites·26 claims
- 0693US8275190B2Method and apparatus for inspecting pattern defectsSAKAI KAORU·Filed 2011·Granted Sep 25, 2012·13 cites·10 claims
- 0793US6900888B2Method and apparatus for inspecting a pattern formed on a substrateHITACHI HIGH TECH CORP·Filed 2003·Granted May 31, 2005·38 cites·23 claims
- 0892US7792352B2Method and apparatus for inspecting pattern defectsHITACHI HIGH TECH CORP·Filed 2008·Granted Sep 7, 2010·17 cites·29 claims
- 0991US7330248B2Method and apparatus for inspecting defectsHITACHI LTD·Filed 2005·Granted Feb 12, 2008·15 cites·15 claims
- 1090US8103087B2Fault inspection methodMAEDA SHUNJI·Filed 2007·Granted Jan 24, 2012·19 cites·34 claims
- 1190US7848563B2Method and apparatus for inspecting a defect of a patternHITACHI HIGH TECH CORP·Filed 2006·Granted Dec 7, 2010·18 cites·14 claims
- 1290US7020350B2Image alignment method, comparative inspection method, and comparative inspection device for comparative inspectionsHITACHI LTD·Filed 2001·Granted Mar 28, 2006·42 cites·20 claims
- 1389US7110105B2Method and apparatus for inspecting pattern defectsHITACHI LTD·Filed 2005·Granted Sep 19, 2006·10 cites·7 claims
- 1488US7333677B2Image alignment method, comparative inspection method, and comparative inspection device for comparative inspectionsHITACHI LTD·Filed 2006·Granted Feb 19, 2008·12 cites·10 claims
- 1588US6927847B2Method and apparatus for inspecting pattern defectsHITACHI LTD·Filed 2002·Granted Aug 9, 2005·24 cites·28 claims
- 1687US9075026B2Defect inspection device and defect inspection methodURANO TAKAHIRO·Filed 2010·Granted Jul 7, 2015·11 cites·20 claims
- 1787US8811712B2Defect inspection method and device thereofMAEDA SHUNJI·Filed 2009·Granted Aug 19, 2014·12 cites·12 claims
- 1887US8274652B2Defect inspection system and method of the sameURANO YUTA·Filed 2008·Granted Sep 25, 2012·11 cites·16 claims
- 1987US7620232B2Method and apparatus for pattern inspectionHITACHI HIGH TECH CORP·Filed 2005·Granted Nov 17, 2009·13 cites·14 claims
- 2087US6950545B1Nondestructive inspection method and apparatusHITACHI LTD·Filed 2000·Granted Sep 27, 2005·30 cites·33 claims
- 2187US6831995B1Method for detecting a defect in a pixel of an electrical display unit and a method for manufacturing an electrical display unitHITACHI LTD·Filed 2000·Granted Dec 14, 2004·40 cites·18 claims
- 2286US8639019B2Method and apparatus for inspecting pattern defectsSAKAI KAORU·Filed 2012·Granted Jan 28, 2014·6 cites·8 claims
- 2384US8467594B2Method and apparatus for inspecting patterns formed on a substrateSAKAI KAORU·Filed 2010·Granted Jun 18, 2013·6 cites·6 claims
- 2483US8582864B2Fault inspection methodMAEDA SHUNJI·Filed 2012·Granted Nov 12, 2013·6 cites·12 claims
- 2583US6879392B2Method and apparatus for inspecting defectsHITACHI LTD·Filed 2002·Granted Apr 12, 2005·19 cites·19 claims
- 2682US7433508B2Pattern inspection method and its apparatusHITACHI HIGH TECH CORP·Filed 2004·Granted Oct 7, 2008·21 cites·15 claims
- 2782US7142708B2Defect detection method and its apparatusHITACHI LTD·Filed 2002·Granted Nov 28, 2006·31 cites·23 claims
- 2881US10529068B2Defect inspection method and apparatusHITACHI POWER SOLUTIONS CO LTD·Filed 2019·Granted Jan 7, 2020·2 cites·13 claims
- 2981US8824774B2Method and apparatus for inspecting patterns formed on a substrateHITACHI HIGH TECH CORP·Filed 2013·Granted Sep 2, 2014·4 cites·12 claims
- 3081US7215807B2Nondestructive inspection method and apparatusHITACHI LTD·Filed 2005·Granted May 8, 2007·7 cites·10 claims
- 3180US7949178B2Pattern inspection method and its apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted May 24, 2011·7 cites·9 claims
- 3280US6153256AChip resistor and method of making the sameROHM CO LTD·Filed 1999·Granted Nov 28, 2000·33 cites·8 claims
- 3378US8340395B2Defect inspection method and apparatus thereforSAKAI KAORU·Filed 2009·Granted Dec 25, 2012·12 cites·8 claims
- 3478US7646477B2Method and apparatus for inspecting a pattern formed on a substrateHITACHI HIGH TECH CORP·Filed 2005·Granted Jan 12, 2010·4 cites·12 claims
- 3577US7903249B2Method and apparatus for inspecting pattern defectsHITACHI LTD·Filed 2009·Granted Mar 8, 2011·3 cites·18 claims
- 3675US8427634B2Defect inspection method and apparatusURANO YUTA·Filed 2009·Granted Apr 23, 2013·3 cites·18 claims
- 3775US8090187B2Pattern inspection method and its apparatusSAKAI KAORU·Filed 2010·Granted Jan 3, 2012·3 cites·7 claims
- 3875US7711178B2Pattern inspection method and its apparatusHITACHI LTD·Filed 2007·Granted May 4, 2010·5 cites·16 claims
- 3974US8253934B2Method and apparatus for inspecting a pattern formed on a substrateYOSHIDA MINORU·Filed 2009·Granted Aug 28, 2012·2 cites·16 claims
- 4072US8755041B2Defect inspection method and apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Jun 17, 2014·3 cites·11 claims
- 4169US7869966B2Inspection method and its apparatus, inspection systemHITACHI LTD·Filed 2004·Granted Jan 11, 2011·6 cites·22 claims
- 4268US8270700B2Method and apparatus for pattern inspectionSAKAI KAORU·Filed 2009·Granted Sep 18, 2012·3 cites·12 claims
- 4366US7462827B2Non-destructive inspection method and apparatus thereforHITACHI GE NUCLEAR ENERGY LTD·Filed 2005·Granted Dec 9, 2008·1 cites·20 claims
- 4466US2024212973A1Processor System Capable of Communicating with Multicharged Particle Beam Device and Method ThereofHITACHI HIGH TECH CORP·Filed 2023·Application pending·0 cites
- 4561US8737718B2Apparatus and method for inspecting defectSAKAI KAORU·Filed 2010·Granted May 27, 2014·1 cites·8 claims
- 4661US8216044B1Method and apparatus for calculating game outcomesSAKAI KAORU·Filed 2008·Granted Jul 10, 2012·0 cites·20 claims
- 4761US5502885AMethod of manfacturing a chip-type composite electronic partROHM CO LTD·Filed 1994·Granted Apr 2, 1996·16 cites·3 claims
- 4857US7489395B2Method and apparatus for inspecting pattern defectsHITACHI LTD·Filed 2006·Granted Feb 10, 2009·0 cites·22 claims
- 4956US6975391B1Method and apparatus for non-destructive testingHITACHI LTD·Filed 1999·Granted Dec 13, 2005·16 cites·17 claims
- 5054US2024036010A1Ultrasonic inspection device, ultrasonic inspection method, and programHITACHI POWER SOLUTIONS CO LTD·Filed 2022·Application pending·0 cites
Showing the top 50 of 68 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →