Inventor · disambiguated record
Kazuhiko Sanada
Also filed as: SANADA KAZUHIKO
10 granted patents·3 pending applications·35 citations·filing 2000–2021
84Inventor score
Files withNEC CORP5NEC ELECTRONICS CORP3SANADA KAZUHIKO2SANDISK TECHNOLOGIES LLC2RENESAS ELECTRONICS CORP1
Top patents by PatentIndex Score
13 records- 0191US8552492B2Semiconductor deviceSANADA KAZUHIKO·Filed 2010·Granted Oct 8, 2013·24 cites·19 claims
- 0262US11081196B2Non-volatile memory with erase verify skipSANDISK TECHNOLOGIES LLC·Filed 2019·Granted Aug 3, 2021·1 cites·14 claims
- 0360US7671399B2Semiconductor storage deviceNEC ELECTRONICS CORP·Filed 2006·Granted Mar 2, 2010·2 cites·16 claims
- 0459US7872329B2Semiconductor device and method of manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2008·Granted Jan 18, 2011·2 cites·12 claims
- 0557US11495311B2Non-volatile memory with erase verify skipSANDISK TECHNOLOGIES LLC·Filed 2021·Granted Nov 8, 2022·0 cites·20 claims
- 0654US6919596B2Structure of a capacitive element of a booster circuit included in a semiconductor device and method of manufacturing such a structureNEC ELECTRONICS CORP·Filed 2002·Granted Jul 19, 2005·6 cites·6 claims
- 0740US2007085132A1Semiconductor memory device and method for producing sameNEC ELECTRONICS CORP·Filed 2006·Application pending·0 cites
- 0835US2002036349A1Semiconductor device and manufacturingNEC CORP·Filed 2001·Application pending·0 cites
- 0932US8436421B2Semiconductor device with trench gate transistors and method for production thereofSANADA KAZUHIKO·Filed 2011·Granted May 7, 2013·0 cites·8 claims
- 1032US6330191B2Semiconductor storage device and production method thereofNEC CORP·Filed 2000·Granted Dec 11, 2001·0 cites·10 claims
- 1131US6538927B1Semiconductor storage device and production method thereofNEC CORP·Filed 2002·Granted Mar 25, 2003·0 cites·8 claims
- 1230US6498753B2Semiconductor storage device and production method thereofNEC CORP·Filed 2001·Granted Dec 24, 2002·0 cites·10 claims
- 1330US2001052625A1Semiconductor memory device and manufacturing method thereforNEC CORP·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →