Inventor · disambiguated record
Kazuhisa Sueoka
Also filed as: SUEOKA KAZUHISA
19 granted patents·3 pending applications·127 citations·filing 1998–2011
94Inventor score
Files withUNIV HOKKAIDO15JAPAN SCIENCE & TECH AGENCY3AGENCY IND SCIENCE TECHN1JAPAN SCIENCE & TECH CORP1MUKASA KOICHI1
Top patents by PatentIndex Score
22 records- 0176US6667456B2Laser welding method and a laser welding apparatusUNIV HOKKAIDO·Filed 2001·Granted Dec 23, 2003·20 cites·12 claims
- 0274US7041373B2Fibrous solid carbon manifold assembly and method for producing the sameUNIV HOKKAIDO·Filed 2003·Granted May 9, 2006·10 cites·3 claims
- 0370US8072008B2Biosensor having ultra fine fiberMUKASA KOICHI·Filed 2007·Granted Dec 6, 2011·14 cites·2 claims
- 0464US6639218B2Electron spin analyzerUNIV HOKKAIDO·Filed 2001·Granted Oct 28, 2003·6 cites·15 claims
- 0564US6545247B2Laser welding apparatus, a gas shielding apparatus and a method for controlling a laser welding apparatusUNIV HOKKAIDO·Filed 2001·Granted Apr 8, 2003·11 cites·12 claims
- 0663US6757192B2Magnetic recording element, magnetic memory, magnetic recording method, method for fabricating a magnetic recording element, and method for fabricating a magnetic memoryUNIV HOKKAIDO·Filed 2002·Granted Jun 29, 2004·9 cites·18 claims
- 0762US6756931B2Electromagnetic wave absorberUNIV HOKKAIDO·Filed 2003·Granted Jun 29, 2004·15 cites·16 claims
- 0860US6674073B2Scattering target-holding mechanism and an electron spin analyzerUNIV HOKKAIDO·Filed 2001·Granted Jan 6, 2004·4 cites·3 claims
- 0959US7935989B2Single-electron transistor, field-effect transistor, sensor, method for producing sensor, and sensing methodJAPAN SCIENCE & TECH AGENCY·Filed 2004·Granted May 3, 2011·2 cites·5 claims
- 1054US6750450B2Scanning magnetism detector and probeUNIV HOKKAIDO·Filed 2002·Granted Jun 15, 2004·4 cites·23 claims
- 1152US2011180427A1Method for Sensing a Substance to be Detected in a SampleJAPAN SCIENCE & TECH AGENCY·Filed 2011·Application pending·0 cites
- 1251US7052738B2Fibrous solid carbon manifold assembly and method for producing the sameUNIV HOKKAIDO·Filed 2004·Granted May 30, 2006·0 cites·7 claims
- 1351US2011183438A1Method for Sensing a Substance to be Detected in a SampleJAPAN SCIENCE & TECH AGENCY·Filed 2011·Application pending·0 cites
- 1450US6655196B2Scanning probe microscopeUNIV HOKKAIDO·Filed 2002·Granted Dec 2, 2003·4 cites·13 claims
- 1549US6717402B2Probe having at least one magnetic resistive element for measuring leakage magnetic fieldUNIV HOKKAIDO·Filed 2001·Granted Apr 6, 2004·5 cites·16 claims
- 1646US6849821B2Laser welding head-controlling system, a laser welding head and a method for controlling a laser welding headUNIV HOKKAIDO·Filed 2001·Granted Feb 1, 2005·2 cites·14 claims
- 1745US2010032653A1Carbon Nanotube Electric Field Effect Transistor and Process for Producing the SameNAT UNIVERSITY CORPRATION HOKK·Filed 2007·Application pending·0 cites
- 1842US6389210B1Probe with optical waveguide and method of producing the sameJAPAN SCIENCE & TECH CORP·Filed 1999·Granted May 14, 2002·9 cites·6 claims
- 1936US6577213B2Method and apparatus for multiplying a frequency of an electromagnetic waveUNIV HOKKAIDO·Filed 2002·Granted Jun 10, 2003·0 cites·15 claims
- 2035US6078174AApparatus for measuring exchange forceUNIV HOKKAIDO·Filed 1998·Granted Jun 20, 2000·7 cites·9 claims
- 2132US6479980B1Thin film spin probeAGENCY IND SCIENCE TECHN·Filed 1999·Granted Nov 12, 2002·2 cites·6 claims
- 2231US6081115AMethod of measuring exchange force and method of evaluating magnetism using the exchange forceUNIV HOKKAIDO·Filed 1998·Granted Jun 27, 2000·3 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →